TBX Link  for Virtual Conference ​(Registered Attendees)
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Detailed submission instructions can be found at:
Technical Information
You are cordially invited to attend the 2020 IEEE Nuclear and Space Radiation Effects Conference to be held virtually December, 2020. The conference features a technical program consisting of nine technical sessions of contributed papers describing the latest observations about radiation effects on microelectronics, a Short Course on radiation effects issues with current relevance will be offered, a Radiation Effects Data Workshop, and an Industrial Exhibit. The technical program includes oral and poster sessions.

Papers on nuclear and space radiation effects on electronic and photonic materials, devices, circuits, sensors and systems, as well as semiconductor processing technology and design techniques for producing radiation-tolerant (hardened) devices and integrated circuits, will be presented at this meeting of engineers, scientists and managers. International participation is strongly encouraged. We are soliciting papers describing significant new findings in the following or related areas:

Basic Mechanisms of Radiation Effects in Electronic Materials and Devices
  • Single Event Charge Collection Phenomena and Mechanisms
  • Ionizing Radiation Effects
  • Displacement Damage
  • Radiation Transport, Energy Deposition, and Dosimetry
  • Materials and Device Effects
  • Processing-Induced Radiation Effects
Radiation Effects on Electronic and Photonic Devices, Circuits, and Systems
  • Single Event Effects, Total Dose, and Displacement Damage
  • MOS, Bipolar, and Advanced Technologies
  • Systems on a Chip, GPUs, FPGAs, Microprocessors
  • Isolation Technologies, such as SOI and SOS
  • Methods for Hardened Design and Manufacturing
  • Modeling and Hardening of Devices and Circuits
  • Cryogenic or High Temperature Effects
  • Novel Device Structures, such as MEMS and Nanotechnologies
  • Emerging Modeling and Experimental Techniques for Hardening Systems
Space, Atmospheric, and Terrestrial Radiation Effects
  • Characterization and Modeling of Radiation Environments
  • Space Weather Events and Effects
  • Spacecraft Charging
  • Predicting and Verifying Soft Error Rates (SER)
Hardness Assurance Technologies, Modeling, and Testing
  • New Modeling and Testing Techniques, Guidelines, and Hardness Assurance Methodologies
  • Unique Radiation Exposure Facilities or Novel Instrumentation Methods
  • Dosimetry

New Developments of Interest to the Radiation Effects Community
Radiation Effects Data Workshop
The Radiation Effects Data Workshop is a forum for papers on radiation effects data on electronic devices and systems. Workshop papers are intended to provide radiation response data to scientists and engineers who use electronic devices in a radiation environment, and for designers of radiation-hardened systems. Papers describing new simulation or radiation facilities are also welcomed. The procedure for submitting a summary to the Workshop is identical to the procedure for submitting NSREC summaries. Radiation Effects Data Workshop papers will be published in a Workshop Record and are not candidates for publication in the Conference issue of the IEEE Transactions on Nuclear Science.
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