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2008
IEEE NUCLEAR AND SPACE
RADIATION
EFFECTS CONFERENCE
Short
Course and Radiation Effects Data Workshop
July 14-18, 2008
JW Marriott Starr Pass Resort & Spa
Tucson, Arizona (USA)
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LATE NEWS SUMMARY DEADLINE JUNE 1, 2008 AT MIDNIGHT (PST)
SUBMIT LATE NEWS SUMMARY HERE
SPONSORED BY
IEEE/NPSS Radiation Effects Committee
SUPPORTED BY
Defense Threat Reduction Agency
Air Force Research Laboratory
Sandia National Laboratories
Jet Propulsion Laboratory
NASA Electronic Parts and Packaging Program
BAE Systems
Micro-RDC
Boeing
Northrop Grumman
Aeroflex Colorado Springs
CONFERENCE COMMITTEE
General Chairman
Paul Dodd
Sandia National Laboratories
505-844-1447
Technical Program
Nick van Vonno
Consultant/Intersil
321-255-2791
Local Arrangements
Bill Heidergott
General Dynamics
480-441-4598
Short Course
Jeff Black
Vanderbilt/ISDE
615-322-3758
Publicity
Teresa Farris
Aeroflex Colorado Springs
719-594-8035
Finance
Gary Lum
Lockheed Martin
408-756-0120
Awards
Mike Xapsos
NASA/GSFC
301-286-2263
Industrial Exhibits
John Jewell
Sandia National Laboratories
505-797-8846
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The 2008 IEEE International Nuclear and Space Radiation
Effects Conference will be held July 14-18 in Tucson, Arizona at the JW Marriott Starr Pass Resort & Spa.
The Conference features a technical program
consisting of eight to ten sessions of contributed papers describing the
latest observations in radiation effects, an up-to-date Short Course on
radiation effects offered on July 14, a Radiation Effects Data Workshop,
and an Industrial Exhibit. The technical program includes oral and
poster sessions.
Papers describing nuclear and space radiation effects on electronic
and photonic materials, devices, circuits, sensors, and systems, as well
as semiconductor processing technology and techniques for producing radiation-tolerant
(hardened) devices and integrated circuits, will be presented at this meeting
of engineers, scientists, and managers. International participation
is strongly encouraged.
We are soliciting papers describing significant new findings in the following
or related areas:
Basic Mechanisms of Radiation Effects in Electronic Materials and Devices
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Ionizing Radiation Effects
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Materials and Device Effects
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Displacement Damage
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Single-Event Charge Collection Phenomena and Mechanisms
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Radiation Transport, Energy Deposition and Dosimetry
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Processing-Induced Radiation Effects
Radiation Effects on Electronic and Photonic Devices and Circuits
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MOS, Bipolar, and Advanced Technologies
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Isolation Technologies, such as SOI and SOS
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Optoelectronic and Optical Devices and Systems
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Methods for Hardened Design and Manufacturing
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Modeling of Devices, Circuits and Systems
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Particle Detectors and Associated Electronics for High-Energy Accelerators
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Cryogenic or High Temperature Effects
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Single-Event Effects
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Novel Device Structures, such as MEMs and Nanotechnologies
Space, Atmospheric, and Terrestrial Radiation Effects
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Characterization and Modeling of Radiation Environments
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Space Weather Events and Effects
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Spacecraft Charging
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Soft Error Rates (SER)
Hardness Assurance Technology and Testing
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Testing Techniques, Guidelines and Hardness Assurance Methodology
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Radiation Exposure Facilities
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Dosimetry
New Developments of Interest the Radiation Effects Community
LATE NEWS SUMMARY DEADLINE: JUNE 1, 2008 |
PROCEDURE
FOR SUBMITTING
SUMMARIES
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Authors must conform to the following requirements:
1. Prepare a single Adobe Acrobat file (maximum 5 pages) consisting of (a) an abstract no longer than 35 words on the first page, followed by
(b) an informative two to four page summary describing results (appropriate
for a poster presentation). On the first page, please include title, names and company affiliation of the authors,
and company address (city, state, country). Identify the author presenting the paper and provide telephone, fax, and email address.
2. The summary must include sufficient detail about the work to permit a meaningful technical review.
In the summary, clearly indicate (a) the purpose of your work, (b) significant new results with supporting technical material,
and (c) how your work advances the state of the art. Show key references to other related work. The summary must be no less than two and no more than four pages in length, including figures and tables (one additional page is allowed for the 35-word abstract).
All figures and tables must be large enough to be clearly read. Note that this is more than an abstract,
but do not exceed four pages.
3. Prepare your summary in single-column format, using 11 point or greater font, formatted for either
U.S. Standard, 8.5 inch (21.6 cm) x 11 inch (27.9 cm), or A4 (21 cm x 29.7 cm) page layout, with 1 inch (2.5 cm)
margins on all four sides.
4. Obtain all corporate, sponsor, and government approvals and releases necessary for presenting
your paper at an open-attendance international meeting.
5. Summary submission consists of an Author Information Form and a PDF-format copy of the four-page summary.
Submission is electronic only, through www.nsrec.com. Details on the submission process may be found at www.nsrec.com.
Authors are requested to state their preference for presentation (oral, poster, or data workshop poster) and for session.
However, the final category of all papers will be determined by the Technical Program Committee, which is responsible for
selecting final papers from initial submissions.
Papers accepted for oral or poster presentation at the technical program will
be eligible for publication in the Conference issue of the IEEE Transactions
on Nuclear Science (December 2008), based on a separate submission
of a complete paper, and subject to an independent review after the Conference.
Further information will be sent to prospective authors upon acceptance
of their NSREC summary. It is not necessary to be an IEEE member
to present a paper or attend the NSREC. However, we encourage IEEE
membership of all NSREC participants.
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RADIATION EFFECTS DATA WORKSHOP |
The Radiation Effects Data Workshop is a forum for papers on radiation
effects data on electronic devices and systems. Workshop papers are
intended to provide radiation response data to scientists and engineers
who use electronic devices in a radiation environment, and for designers
of radiation-hardened systems. Papers describing new simulation
or radiation facilities are also welcomed. The procedure for
submitting a summary to the Workshop is identical to the procedure
for submitting NSREC summaries. Radiation Effects Data Workshop papers
will be published in a Workshop Record and are not candidates for publication
in the Conference issue of the IEEE Transactions on Nuclear Science.
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TUCSON, ARIZONA |
NSREC 2008 will be held at the JW Marriott Starr Pass Resort cradled in the Tucson Mountains just west of Tucson, Arizona.
The resort is Tucson's premier convention destination, featuring a newly redesigned 27-hole Arnold Palmer signature golf facility offering
views of the city and a majestic landscape of towering saguaros and the Sonoran Desert. A fitness center, hiking the mountain desert
terrain, swimming and whirlpools, and the Hashani Sap may be followed by dining at one of the five restaurants located at Starr Pass.
Exploring the region by horseback, Jeep, hiking, or bicycling, and trips to nearby Kitt Peak National Observatory, Arizona-Sonora Desert
Museum, Saguaro National Parks, Old Tucson Studios, Nogales, Mexico, San Xavier del Bac mission, the Pima Air & Space Museum,
the Presidio de San Ignacio de Tubac, the mission at Tumacacori National Historical Park, Tombstone, and Kartchner Caverns or Colossal
Cave are but a few of the sight-seeing, shopping, and dining opportunities during our stay in Tucson. In addition to the luxurious accommodations
of the Starr Pass Resort, the natural beauty and diverse culture of the Old Pueblo provide a perfect backdrop for the NSREC 2008 conference.
For more information on Tucson and Southern Arizona, visit www.visittucson.org, for additional information of JW Marriott Starr Pass Resort & Spa,
visit www.jwmarriottstarrpass.com.
Photo courtesy of JW Marriott Starr Pass Resort.
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