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SUMMARY SUBMISSION DEADLINE FEBRUARY 3, 2012
SUBMIT SUMMARY
SPONSORED BY
IEEE/NPSS Radiation Effects Committee
SUPPORTED BY
Defense Threat Reduction Agency
Air Force Research Laboratory
Sandia National Laboratories
Jet Propulsion Laboratory
NASA Electronic Parts and Packaging Program
Aeroflex
Atmel
BAE Systems
Boeing
Honeywell
International Rectifier
Intersil Corporation
Northrop Grumman
Southwest Research Institute
Synopsys, Inc.
Texas Instruments
NASA Living With a Star
CONFERENCE COMMITTEE
General Chairman
Ken LaBel
NASA GSFC
kenneth.a.label@nasa.gov
Technical Program
Christian Poivey
ESA ESTEC
christian.poivey@esa.int
Local Arrangements
Lew Cohn
National Reconnaisance Office
lewismcohn@aol.com
Short Course
Ron Schrimpf
Vanderbilt University
ron.schrimpf@vanderbilt.edu
Publicity
Teresa Farris
Aeroflex Colorado Springs
teresa.farris@aeroflex.com
Finance
Keith Avery
AFRL
keith.avery@kirtland.af.mil
Awards
Philippe Paillet
CEA
philippe.paillet@cea.fr
Industrial Exhibits
Penny Meeker
US Semi
Pennym@us-semi.com
Web Support
Martha O'Bryan
MEI Tech. Inc. at NASA/GSFC
martha.v.obryan@nasa.gov
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The 2012 IEEE Nuclear and Space Radiation Effects Conference will be held July 16 - 20 at the
InterContinental Miami. The conference features a technical program consisting of eight to ten
technical sessions of contributed papers describing the latest observations in radiation effects,
a Short Course on radiation effects offered on July 16, a Radiation Effects Data Workshop,
and an Industrial Exhibit. The technical program includes oral and poster sessions.
Papers on nuclear and space radiation effects on electronic and photonic materials, devices,
circuits, sensors, and systems, as well as semiconductor processing technology and design
techniques for producing radiation-tolerant (hardened) devices and integrated circuits, will be
presented at this meeting of engineers, scientists, and managers. International participation
is strongly encouraged.
We are soliciting papers describing significant new findings in the following or related areas:
Basic Mechanisms of Radiation Effects in Electronic Materials and Devices
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Single-Event Charge Collection Phenomena and Mechanisms
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Radiation Transport, Energy Deposition and Dosimetry
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Ionizing Radiation Effects
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Materials and Device Effects
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Displacement Damage
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Processing-Induced Radiation Effects
Radiation Effects on Electronic and Photonic Devices and Circuits
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Single-Event Effects
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MOS, Bipolar and Advanced Technologies
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Isolation Technologies, such as SOI and SOS
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Optoelectronic and Optical Devices and Systems
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Methods for Hardened Design and Manufacturing
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Modeling of Devices, Circuits and Systems
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Particle Detectors and Associated Electronics for High-Energy Accelerators and Nuclear Power Facilities
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Cryogenic or High Temperature Effects
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Novel Device Structures, such as MEMs and Nanotechnologies
Space, Atmospheric, and Terrestrial Radiation Effects
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Characterization and Modeling of Radiation Environments
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Space Weather Events and Effects
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Spacecraft Charging
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Predicting and Verifying Soft Error Rates (SER)
Hardness Assurance Technology and Testing
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New Testing Techniques, Guidelines and Hardness Assurance Methodology
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Unique Radiation Exposure Facilities or Novel Instrumentation Methods
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Dosimetry
New Developments of Interest to the Radiation Effects Community
SUMMARY SUBMISSION DEADLINE: FEBRUARY 3, 2012 |
PROCEDURE
FOR SUBMITTING
SUMMARIES
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Authors must conform to the following requirements:
1. Prepare a single Adobe Acrobat file consisting of a cover page and an informative two to four page
summary describing results appropriate for 12-minute oral or a poster presentation. The cover page must provide
an abstract no longer than 35 words, the title, name and company affiliation of the authors, and company address
(city, state, country). Identify the author presenting the paper and provide telephone, fax, and email address.
The summary must include sufficient detail about the work to permit a meaningful technical review. In the summary,
clearly indicate (a) the purpose of your work, (b) significant new results with supporting technical material, and (c)
how your work advances the state of the art. Show key references to other related work. The summary must be
no less than two and no more than four pages in length, including figures and tables. All figures and tables must
be large enough to be clearly read. Note that this is more than an abstract, but do not exceed four pages.
2. Prepare your summary in single-column format, using 11 point or greater font size, formatted for either
U.S. Standard (8.5 x 11 inch) or A4 (21 x 29.7 cm) page layout, with 1 inch (2.5 cm) margins on all four sides.
3. Obtain all corporate, sponsor, and government approvals and releases necessary for presenting your
paper at an open attendance international meeting.
4. Summary submission is electronic only, through www.nsrec.com. The submission process consists of
entering the paper title, author(s) and affiliation(s), and an abstract no longer than 35 words. Authors are prompted to
state their preference for presentation (oral, poster, or data workshop poster) and for session. Details of the
submission process may be found at www.nsrec.com. The final category of all papers will be determined by the
Technical Program Committee, which is responsible for selecting final papers from initial submissions.
Papers accepted for oral or poster presentation at the technical program will be eligible for publication in a special
issue of the IEEE Transactions on Nuclear Science (December 2012) based upon papers from the Conference. Selection
for this issue will be based on a separate submission of a complete paper. These papers will be subject to the standard
full peer review given all papers submitted to the IEEE Transactions on Nuclear Science. Further information will be sent
to prospective authors upon acceptance of their NSREC summary. It is not necessary to be an IEEE member to present
a paper or attend the NSREC. However, we encourage IEEE and NPSS membership of all NSREC participants.
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RADIATION EFFECTS DATA WORKSHOP |
The Radiation Effects Data Workshop is a forum for papers on radiation effects data on electronic devices
and systems. Workshop papers are intended to provide radiation response data to scientists and engineers who use electronic
devices in a radiation environment, and for designers of radiation-hardened systems. Papers describing new simulation or radiation
facilities are also welcomed. The procedure for submitting a summary to the Workshop is identical to the procedure for submitting
NSREC summaries. Radiation Effects Data Workshop papers will be published in a Workshop Record and are not candidates for
publication in the Conference issue of the IEEE Transactions on Nuclear Science.
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MIAMI, FLORIDA |
Discover a new dimension of sophisticated elegance at InterContinental Miami (http://www.icmiamihotel.com).
This grand downtown Miami hotel offers richly appointed accommodations, as well as fine dining and world-class spa. From a
dramatic marble exterior to a newly restyled marble lobby with a soaring atrium and massive marble sculpture, the InterContinental
Miami specializes in an international flair. Overlooking beautiful Biscayne Bay, this formidable hotel places you in the epicenter of
Miami’s pulsing nightlife, brilliant white-sand beaches, golf courses, and sizzling culture. Immerse yourself in the height of cosmopolitan
style – walk to nearby entertainment complexes, a myriad of restaurants, and the third largest jewelry district in the U.S.; only minutes
by transportation from South Beach and the Art Deco District, the Port of Miami, Coconut Grove, Coral Gables, and Key Biscayne.
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Only 7.5 miles from Miami International Airport (MIA), 25 miles from Fort Lauderdale International Airport (FLL)
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Multilingual, experienced staff (fluent in more than 11 languages)
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Heated outdoor pool/stylish sundeck, overlooking Biscayne Bay
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New modern fitness center, with cutting-edge equipment/beauty salon
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New full-service spa/steam rooms/sauna/stylish lounges
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Three stylish restaurants and cocktail lounges/gift shop/florist
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