You are cordially invited to attend the 2020 IEEE Nuclear and Space Radiation Effects Conference to be held July 20-24, 2020 at the Hilton Santa Fe Buffalo Thunder, in Santa Fe, New Mexico. The conference features a technical program consisting of eight to ten technical sessions of contributed papers describing the latest observations in radiation effects, a Short course on a radiation effects issue with current relevance offered on July 20, a Radiation Effects Data Workshop, and an Industrial Exhibit. The technical program includes oral and poster sessions.
Papers on nuclear and space radiation effects on electronic and photonic materials, devices, circuits, sensors, and systems, as well as semiconductor processing technology and design techniques for producing radiation-tolerant (hardened) devices and integrated circuits, will be presented at this meeting of engineers, scientists, and managers. International participation is strongly encouraged.
We are soliciting papers describing significant new findings in the following or related areas:
Basic Mechanisms of Radiation Effects in Electronic Materials and Devices
Radiation Effects on Electronic and Photonic Devices, Circuits and Systems
Space, Atmospheric, and Terrestrial Radiation Effects
Hardness Assurance Technology and Testing
New Developments of Interest to the Radiation Effects Community