Welcome to Nuclear & Space Radiation Effects Conference


On behalf of the Institute of Electrical and Electronics Engineers (IEEE), its Nuclear and Plasma Sciences Society (NPSS), the Radiation Effects Steering Group (RESG) and the 2021 Nuclear and Space Radiation Effects Conference (NSREC) committee and volunteers, it is my pleasure to invite you to attend the 58th NSREC to be held July 17-23, 2021 in a world-wide interactive virtual setting.

We will offer an excellent Technical program described below:

Late News Deadline: May 14, 2021
You are cordially invited to attend the 2021 IEEE Nuclear and Space Radiation Effects Conference to be held July 17-23, 2021 in an interactive virtual setting. The conference features a technical program consisting of eight to ten technical sessions of contributed papers describing the latest observations in radiation effects, a Short Course on radiation effects issues with current relevance offered on July 19, a Radiation Effects Data Workshop, and an Industrial Exhibit. The technical program includes oral and poster sessions.

Papers on nuclear and space radiation effects on electronic and photonic materials, devices, circuits, sensors and systems, as well as semiconductor processing technology and design techniques for producing radiation-tolerant (hardened) devices and integrated circuits, will be presented at this meeting of engineers, scientists and managers. International participation is strongly encouraged. We are soliciting papers describing significant new findings in the following or related areas:

Basic Mechanisms of Radiation Effects in Electronic Materials and Devices
  • Single Event Charge Collection Phenomena and Mechanisms
  • Ionizing Radiation Effects
  • Displacement Damage
  • Radiation Transport, Energy Deposition, and Dosimetry
  • Materials and Device Effects
  • Processing-Induced Radiation Effects

Radiation Effects on Electronic and Photonic Devices, Circuits, and Systems
  • Single Event Effects, Total Dose, and Displacement Damage
  • MOS, Bipolar, and Advanced Technologies
  • Systems on a Chip, GPUs, FPGAs, Microprocessors
  • Isolation Technologies, such as SOI and SOS
  • Methods for Hardened Design and Manufacturing
  • Modeling and Hardening of Devices and Circuits
  • Cryogenic or High Temperature Effects
  • Novel Device Structures, such as MEMS and Nanotechnologies
  • Emerging Modeling and Experimental Techniques for Hardening Systems

Space, Atmospheric, and Terrestrial Radiation Effects
  • Characterization and Modeling of Radiation Environments
  • Space Weather Events and Effects
  • Spacecraft Charging
  • Predicting and Verifying Soft Error Rates (SER)

Hardness Assurance Technologies, Modeling, and Testing
  • New Modeling and Testing Techniques, Guidelines, and Hardness Assurance Methodologies
  • Unique Radiation Exposure Facilities or Novel Instrumentation Methods
  • Dosimetry

New Developments of Interest to the Radiation Effects Community
Sponsored by:
Supported by: