Technical Program

NOTICE:
Due to the COVID-19 Pandemic Registration will be Delayed until further notice.
Stay Tuned.
We are encouraging abstract submission related to Radiation Effects in Systems;
particularly in line with the emerging industry trends about inserting advanced commercial electronics into space systems.

Detailed submission instructions can be found at:

Submit Summary and Instructions

Technical Information

You are cordially invited to attend the 2020 IEEE Nuclear and Space Radiation Effects Conference to be held July 20-24, 2020 at the Hilton Buffalo Thunder, in Santa Fe, New Mexico. The conference features a technical program consisting of eight to ten technical sessions of contributed papers describing the latest observations in radiation effects, a Short course on radiation effects issues with current relevance offered on July 20, a Radiation Effects Data Workshop, and an Industrial Exhibit. The technical program includes oral and poster sessions.

Papers on nuclear and space radiation effects on electronic and photonic materials, devices, circuits, sensors and systems, as well as semiconductor processing technology and design techniques for producing radiation-tolerant (hardened) devices and integrated circuits, will be presented at this meeting of engineers, scientists and managers. International participation is strongly encouraged. We are soliciting papers describing significant new findings in the following or related areas:

Basic Mechanisms of Radiation Effects in Electronic Materials and Devices

Single Event Charge Collection Phenomena and Mechanisms
Ionizing Radiation Effects
Displacement Damage
Radiation Transport, Energy Deposition, and Dosimetry
Materials and Device Effects
Processing-Induced Radiation Effects

Radiation Effects on Electronic and Photonic Devices, Circuits, and Systems

Single Event Effects, Total Dose, and Displacement Damage
MOS, Bipolar, and Advanced Technologies
Systems on a Chip, GPUs, FPGAs, Microprocessors
Isolation Technologies, such as SOI and SOS
Methods for Hardened Design and Manufacturing
Modeling and Hardening of Devices and Circuits
Cryogenic or High Temperature Effects
Novel Device Structures, such as MEMS and Nanotechnologies
Emerging Modeling and Experimental Techniques for Hardening Systems

Space, Atmospheric, and Terrestrial Radiation Effects

Characterization and Modeling of Radiation Environments
Space Weather Events and Effects
Spacecraft Charging
Predicting and Verifying Soft Error Rates (SER)

Hardness Assurance Technologies, Modeling, and Testing

New Modeling and Testing Techniques, Guidelines, and Hardness Assurance Methodologies
Unique Radiation Exposure Facilities or Novel Instrumentation Methods
Dosimetry

New Developments of Interest to the Radiation Effects Community

Radiation Effects Data Workshop

The Radiation Effects Data Workshop is a forum for papers on radiation effects data on electronic devices and systems. Workshop papers are intended to provide radiation response data to scientists and engineers who use electronic devices in a radiation environment, and for designers of radiation-hardened systems. Papers describing new simulation or radiation facilities are also welcomed. The procedure for submitting a summary to the Workshop is identical to the procedure for submitting NSREC summaries. Radiation Effects Data Workshop papers will be published in a Workshop Record and are not candidates for publication in the Conference issue of the IEEE Transactions on Nuclear Science.