{"id":8546,"date":"2025-05-12T22:31:22","date_gmt":"2025-05-12T22:31:22","guid":{"rendered":"https:\/\/www.nsrec.com\/?page_id=8546"},"modified":"2026-06-25T01:30:38","modified_gmt":"2026-06-25T01:30:38","slug":"session-e","status":"publish","type":"page","link":"https:\/\/www.nsrec.com\/session-e\/","title":{"rendered":"Technical Program 2026 – Session E"},"content":{"rendered":"[vc_row][vc_column][vc_column_text]\n

2026 IEEE NSREC TECHNICAL PROGRAM<\/strong><\/h2>\n

SESSION E SCHEDULE<\/strong><\/h2>\n

PUERTO RICO CONVENTION CENTER, SAN JUAN, PR<\/strong><\/h2>\n

WEDNESDAY, JULY 22, 2026<\/strong><\/h2>\n[\/vc_column_text][\/vc_column][\/vc_row]\n[vc_row][vc_column width=”1\/4″][vc_column_text]SESSION E<\/strong>
Ballroom A[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text]ENVIRONMENTS, FACILITIES, AND DOSIMETRY<\/strong>[\/vc_column_text][\/vc_column][\/vc_row]\n[vc_row][vc_column width=”1\/4″][vc_column_text]11:35 AM[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text]SESSION INTRODUCTION<\/strong>
Chair: Cornelia Hoehr (TRIUMF)[\/vc_column_text][\/vc_column][\/vc_row]\n[vc_row][vc_column width=”1\/4″][vc_column_text]E-1<\/strong>
11:40 AM[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text]\n

TimePix2 and SOI Microdosimeter: Comparison of Response in Heavy Ion Beam<\/strong><\/p>\n

L. Tran1<\/sup>, D. Miller1<\/sup>, S. George2<\/sup>, V. Pan1<\/sup>, J. Vohradsky1<\/sup>, D. Bennett1<\/sup>, S. Rozhdestvenskyy3<\/sup>, M. Povoli4<\/sup>, A. Kok4<\/sup>, S. Kodaira5<\/sup>, H. Kitamura5<\/sup>, T. Inaniwa5<\/sup>, L. Pinsky3<\/sup>, A. Rosenfeld1<\/sup><\/p>\n

1. University of Wollongong, Australia   2. NASA, USA   3. University of Houston, USA   4. SINTEF, Norway   5. National Institutes for Quantum and Radiological Science and Technology, Japan<\/p>\n

SOI microdosimeter and TimePix responses were compared behind aluminium shielding of varying thicknesses to simulate astronaut exposure using 290MeV\/u 12C, 400MeV\/u Ne, 800MeV\/u 28Si, and 650MeV\/u 40Ar ions. Good agreement was observed.<\/p>\n[\/vc_column_text][\/vc_column][\/vc_row]\n[vc_row][vc_column width=”1\/4″][vc_column_text]E-2<\/strong>
11:55 AM[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text]\n

Temperature Calibration of Radioluminescent Pure Silica Core Fiber Based Dosimeters for Space Applications<\/strong><\/p>\n

S. Acid1,2<\/sup>, A. Morana2<\/sup>, I. Zghari3<\/sup>, M. Aubry4<\/sup>, N. Kerboub1<\/sup>, J. Guillermin4<\/sup>, J. Mekki1<\/sup>, Y. Ouerdane2<\/sup>, M. Darnon2<\/sup>, H. El Hamzaoui3<\/sup>, B. Capoen3<\/sup>, M. Bouazaoui3<\/sup>, A. Boukenter2<\/sup>, S. Girard2<\/sup><\/p>\n

1. CNES, France   2. Universit\u00e9 de Saint Etienne, France   3. Universit\u00e9 de Lille, France   4. TRAD, France<\/p>\n

We demonstrate temperature calibrated radioluminescent dosimetry using pre-irradiated pure silica core optical fibers, achieving stable real-time dose-rate measurements under coupled temperature and dose-rate variations, with mean errors below 1.5%, validating feasibility for space radiation monitoring.<\/p>\n[\/vc_column_text][\/vc_column][\/vc_row]\n[vc_row][vc_column width=”1\/4″][vc_column_text]E-3<\/strong>
2:00 PM[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text]\n

Commercial Solid-State Detectors for Identifying Pulsed-Laser Operating Parameters for Surrogate SEE Testing<\/strong><\/p>\n

J. Hales1<\/sup>, A. Ildefonso2<\/sup>, T. Crane1<\/sup>, A. Khachatrian1<\/sup>, D. McMorrow1<\/sup><\/p>\n

1. US Naval Research Laboratory, USA   2. Indiana University Bloomington, USA<\/p>\n

This work identifies solid-state detectors that exhibit transient responses which are strongly dependent on pulsed-laser operating parameters. Such standardized reference detectors are important for providing repeatability and traceability in surrogate single- event effects testing.<\/p>\n[\/vc_column_text][\/vc_column][\/vc_row]\n[vc_row][vc_column width=”1\/4″][vc_column_text]E-4<\/strong>
2:15 PM[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text]\n

Influence of Pure-Silica Core Optical Fibers as Transport Fibers in a Radioluminescence- based Dosimetry System<\/strong><\/p>\n

F. Fricano1<\/sup>, A. Morana2<\/sup>, Y. Ouerdane2<\/sup>, D. Lambert1<\/sup>, P. Paillet1<\/sup>, S. Girard2<\/sup><\/p>\n

1. CEA\/CESTA, France   2. Universit\u00e9 de Saint Etienne, France<\/p>\n

The influence of fibers with different hydroxyl (OH) group contents, commonly used as transport fibers in dosimetry systems based on the radioluminescence of scintillating optical fibers, such as Ce3+-doped fibers, is evaluated.<\/p>\n[\/vc_column_text][\/vc_column][\/vc_row]\n[vc_row][vc_column width=”1\/4″][vc_column_text]E-5<\/strong>
2:30 PM[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text]\n

Dual-Reference-Level Inversion for High-Linearity In-Situ Radiation Dosimetry in 3D NAND Flash<\/strong><\/p>\n

M. Dong1<\/sup>, W. Chen1<\/sup>, Z. Zhang1<\/sup>, Y. Ouyang1<\/sup>, L. Cai1<\/sup><\/p>\n

1. Sun Yat-sen University, China<\/p>\n

This work demonstrates a high-linearity radiation dosimeter using commercial 3D NAND. The dual-reference-level sampling technique achieves linearity above 0.9867 up to 35 krad(Si) with 3.0% maximum relative error, enabling accurate in-situ monitoring for aerospace applications.<\/p>\n[\/vc_column_text][\/vc_column][\/vc_row]\n[vc_row][vc_column][vc_column_text]\n

POSTER SESSION E<\/strong><\/h2>\n[\/vc_column_text][\/vc_column][\/vc_row]\n[vc_row][vc_column width=”1\/4″][vc_column_text]PE-1<\/strong>[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text]\n

Real-time Monitoring of the CHARM Mixed Field Irradiation with Optical Fiber Dosimeters<\/strong><\/p>\n

L. Weninger1<\/sup>, S. Acid1,2<\/sup>, Y. Aguiar3<\/sup>, R. Garcia3<\/sup>, N. Kerboub2<\/sup>, S. Fiore3<\/sup>, D. Prelipcean3<\/sup>, A. Morana1<\/sup>, S. Girard1<\/sup><\/p>\n

1. Universit\u00e9 de Saint Etienne, France   2. CNES, France   3. CERN, Switzerland<\/p>\n

We propose a novel approach to adapt optical-fiber based dosimeters based on the radiation-induced luminescence (RIL) phenomenon to the pulsed (spill-based time structure) mixed-field environment of the CHARM facility at CERN.<\/p>\n[\/vc_column_text][\/vc_column][\/vc_row]\n[vc_row][vc_column width=”1\/4″][vc_column_text]PE-2<\/strong>[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text]\n

Very High-Energy Heavy-Ion SEE Testing Results at the HEARTS@CERN Facility During the 2025 Run<\/strong><\/p>\n

B. Tissot Ferraz1<\/sup>, T. Beene1<\/sup>, D. S\u00f6derstr\u00f6m1<\/sup>, I. Slipukhin1<\/sup>, R. Garcia1<\/sup>, N. Emriskova1<\/sup>, A. Waets1<\/sup>, Y. Aguiar1<\/sup>, D. Prelipcean1<\/sup>, C. Matteo1<\/sup>, M. Garcia1<\/sup>, D. Lucsanyi1<\/sup>, R. Federico1<\/sup>, G. Pezzullo1<\/sup>, G. Kucharska1<\/sup>, E. Garcia1<\/sup>, J. McCarthy1<\/sup>, M. Delrieux1<\/sup><\/p>\n

1. CERN, Switzerland<\/p>\n

The paper presents the results of Single-Event-Effect testing of commercial electronic devices with very high-energy heavy ions at the HEARTS@CERN facility during the 2025 run, along with the beam characterization and the adopted dosimetry practices.<\/p>\n[\/vc_column_text][\/vc_column][\/vc_row]\n[vc_row][vc_column width=”1\/4″][vc_column_text]PE-3<\/strong>[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text]\n

Evaluating 3-D NAND as a Passive Radiation Dosimeter: A Comparison of FG and CT Technology<\/strong><\/p>\n

M. Kumar1<\/sup>, J. Bell1<\/sup>, A. Brandl1<\/sup>, B. Ray1<\/sup><\/p>\n

1. Colorado State University, USA<\/p>\n

This work experimentally investigates 3-D floating-gate and charge-trap NAND flash as passive radiation dosimeters, showing linear FG sensitivity of ~12.5 mV\/krad(Si), while CT exhibits multi-mechanism, non-linear response with ~35 mV\/krad(Si) initially, reducing to ~18 mV\/krad(Si).<\/p>\n[\/vc_column_text][\/vc_column][\/vc_row]\n[vc_row][vc_column width=”1\/4″][vc_column_text]PE-4<\/strong>[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text]\n

Operational Time-Resolved Single-Event Upset Rate Estimation from On-Board Particle Flux Measurements<\/strong><\/p>\n

A. Koziukov1<\/sup>, G. Protopopov1<\/sup>, M. Kozhukhov1<\/sup>, I. Gvozdev1<\/sup><\/p>\n

1. RH-Forecast LLC, Russian Federation<\/p>\n

This paper presents a time-resolved, measurement-driven approach to estimate SEU rates in spacecraft memories during SPEs by reconstructing particle spectra from GOES-16 and ACE flux measurements. The method is validated against in-flight upset-count data from RHEME-3.<\/p>\n[\/vc_column_text][\/vc_column][\/vc_row]\n[vc_row][vc_column width=”1\/4″][vc_column_text]PE-5<\/strong>[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text]\n

Investigation of the Energy-Dependent Response of Si IGBT and SiC Power MOSFETs to Fast Neutrons<\/strong><\/p>\n

C. Cazzaniga1<\/sup>, F. Principato2<\/sup>, F. Pintacuda3<\/sup>, X. Ledoux4<\/sup>, M. Kastriotou1<\/sup>, C. Frost1<\/sup><\/p>\n

1. STFC, United Kingdom   2. Palermo University, Italy   3. STMicroelectronics, Italy   4. GANIL, France<\/p>\n

Silicon IGBT and silicon carbide power MOSFETs have been studied with fast neutrons in the 2-40 MeV range at GANIL SPIRAL-2 where energy selection is possible. The results can be compared with atmospheric neutron tests.<\/p>\n[\/vc_column_text][\/vc_column][\/vc_row]\n[vc_row][vc_column width=”1\/4″][vc_column_text]PE-6L<\/strong>[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text]\n

Demonstration of High-Energy Laser Accelerated Electron Beam Focusing for Radiation Testing of Electronics<\/strong><\/p>\n

E. McCary1<\/sup>, T. Ha1<\/sup>, P. Franke1<\/sup>, D. Phan1<\/sup>, M. Gracia-Linares1<\/sup>, G. Tiwari1<\/sup>, H. Smith1<\/sup>, L. Labun1<\/sup>, S. Milton1<\/sup>, K. Riordan2<\/sup>, C. Hojbota2<\/sup>, B. Hegelich2<\/sup><\/p>\n

1. Tau Systems Inc, USA   2. Univ. Texas at Austin, USA<\/p>\n

A prototype focusing beamline was built and initial tests demonstrate ~100\u00b5m focused laser-accelerated electron beam diameters with LETs >10 MeV-cm2\/mg at 90 MeV beam energy, corresponding to effective ranges in silicon of ~100\u00b5m.<\/p>\n[\/vc_column_text][\/vc_column][\/vc_row]\n","protected":false},"excerpt":{"rendered":"

[vc_row][vc_column][vc_column_text] 2026 IEEE NSREC TECHNICAL PROGRAM SESSION E SCHEDULE PUERTO RICO CONVENTION CENTER, SAN JUAN, PR WEDNESDAY, JULY 22, 2026 [\/vc_column_text][\/vc_column][\/vc_row] [vc_row][vc_column width=”1\/4″][vc_column_text]SESSION EBallroom A[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text]ENVIRONMENTS, FACILITIES, AND DOSIMETRY[\/vc_column_text][\/vc_column][\/vc_row] [vc_row][vc_column width=”1\/4″][vc_column_text]11:35 AM[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text]SESSION INTRODUCTIONChair: Cornelia Hoehr (TRIUMF)[\/vc_column_text][\/vc_column][\/vc_row] [vc_row][vc_column width=”1\/4″][vc_column_text]E-111:40 AM[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text] TimePix2 and SOI Microdosimeter: Comparison of Response in Heavy Ion Beam L. Tran1, D.… Continue reading Technical Program 2026 – Session E<\/span><\/a><\/p>\n","protected":false},"author":2,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"inline_featured_image":false,"footnotes":""},"class_list":["post-8546","page","type-page","status-publish","hentry","entry"],"acf":{"page_header":[{"ID":8749,"post_author":"2","post_date":"2025-09-04 20:34:04","post_date_gmt":"2025-09-04 20:34:04","post_content":"[vc_row][vc_column][vc_empty_space height=\"125px\"][\/vc_column][\/vc_row][vc_row][vc_column width=\"1\/2\"][vc_column_text]\r\n

IEEE Nuclear & Space Radiation Effects Conference<\/h1>\r\n

JULY 20th-24th, 2026<\/h2>\r\n

San Juan, Puerto Rico, USA<\/h2>\r\n[\/vc_column_text][vc_column_text]\r\n
Follow NSREC [nsrec_social_icons]<\/div>\r\n[\/vc_column_text][vc_empty_space height=\"6px\"][vc_btn title=\"NSREC Brochure\" style=\"3d\" color=\"warning\" size=\"sm\" i_icon_fontawesome=\"fas fa-external-link-alt\" css_animation=\"fadeIn\" add_icon=\"true\" link=\"url:https%3A%2F%2Fwww.nsrec.com%2Fwp-content%2F%2Fuploads%2F2026%2F07%2F2026_NSRECBrochure_Final_V2e.pdf|target:_blank\"][vc_empty_space height=\"6px\"][vc_btn title=\"Schedule at a Glance\" style=\"3d\" color=\"inverse\" size=\"sm\" i_icon_fontawesome=\"fas fa-external-link-alt\" css_animation=\"fadeIn\" add_icon=\"true\" link=\"url:https%3A%2F%2Fwww.nsrec.com%2Fschedule-at-a-glance%2F|target:_blank\"][\/vc_column][vc_column width=\"1\/4\"][vc_single_image image=\"8767\" style=\"vc_box_rounded\"][vc_empty_space height=\"16px\"][vc_btn title=\"Chair's Invitation\" color=\"inverse\" link=\"url:https%3A%2F%2Fwww.nsrec.com%2Fwp-content%2F%2Fuploads%2F2025%2F11%2FInvitation-Letter.pdf|title:Chair%E2%80%99s%20Invitation|target:_blank\"][vc_separator][\/vc_column][vc_column width=\"1\/4\"][vc_empty_space height=\"290px\"][vc_btn title=\"Short Course Description\" color=\"danger\" link=\"url:https%3A%2F%2Fwww.nsrec.com%2Fwp-content%2F%2Fuploads%2F2026%2F04%2FNSREC-2026ShortCourse-FLYER_v6-Final.pdf|title:Short%20Course%20Description|target:_blank\"][vc_empty_space height=\"16px\"][vc_btn title=\"Supporter and Exhibitor Registration\" color=\"danger\" link=\"url:https%3A%2F%2Fcvent.me%2FvlPo1L|title:Supporter%20Registration|target:_blank\"][vc_empty_space height=\"16px\"][vc_btn title=\"Hotel Registration\" color=\"warning\" css_animation=\"lightSpeedIn\" link=\"url:https%3A%2F%2Fbook.passkey.com%2Fevent%2F51004057%2Fowner%2F5772432%2Fhome%3Futm_campaign%3D299386963c%26mobile%3Dtrue%26dw%3D414|title:Hotel%20Registration%20|target:_blank\"][vc_empty_space height=\"16px\"][vc_btn title=\"Conference Registration\" color=\"warning\" css_animation=\"lightSpeedIn\" link=\"url:https%3A%2F%2Fcvent.me%2FaW0lgE|title:Conference%20Registration|target:_blank\"][\/vc_column][\/vc_row][vc_row][vc_column][vc_empty_space height=\"16px\"][\/vc_column][\/vc_row][vc_row][vc_column][\/vc_column][\/vc_row]","post_title":"Main Header 2026","post_excerpt":"","post_status":"publish","comment_status":"closed","ping_status":"closed","post_password":"","post_name":"main-header-2026","to_ping":"","pinged":"","post_modified":"2026-07-19 12:34:21","post_modified_gmt":"2026-07-19 12:34:21","post_content_filtered":"","post_parent":0,"guid":"https:\/\/www.nsrec.com\/?post_type=headers&p=8749","menu_order":0,"post_type":"headers","post_mime_type":"","comment_count":"0","filter":"raw"}]},"_links":{"self":[{"href":"https:\/\/www.nsrec.com\/wp-json\/wp\/v2\/pages\/8546","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.nsrec.com\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.nsrec.com\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.nsrec.com\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/www.nsrec.com\/wp-json\/wp\/v2\/comments?post=8546"}],"version-history":[{"count":5,"href":"https:\/\/www.nsrec.com\/wp-json\/wp\/v2\/pages\/8546\/revisions"}],"predecessor-version":[{"id":9320,"href":"https:\/\/www.nsrec.com\/wp-json\/wp\/v2\/pages\/8546\/revisions\/9320"}],"wp:attachment":[{"href":"https:\/\/www.nsrec.com\/wp-json\/wp\/v2\/media?parent=8546"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}