{"id":8565,"date":"2025-05-12T22:58:50","date_gmt":"2025-05-12T22:58:50","guid":{"rendered":"https:\/\/www.nsrec.com\/?page_id=8565"},"modified":"2026-06-25T01:30:38","modified_gmt":"2026-06-25T01:30:38","slug":"session-g","status":"publish","type":"page","link":"https:\/\/www.nsrec.com\/session-g\/","title":{"rendered":"Technical Program 2026 – Session G"},"content":{"rendered":"[vc_row][vc_column][vc_column_text]\n

2026 IEEE NSREC TECHNICAL PROGRAM<\/strong><\/h2>\n

SESSION G SCHEDULE<\/strong><\/h2>\n

PUERTO RICO CONVENTION CENTER, SAN JUAN, PR<\/strong><\/h2>\n

THURSDAY, JULY 23 & FRIDAY, JULY 24, 2026<\/strong><\/h2>\n[\/vc_column_text][\/vc_column][\/vc_row]\n[vc_row][vc_column width=”1\/4″][vc_column_text]SESSION G<\/strong>
Ballroom A[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text]HARDNESS ASSURANCE: PIECE PARTS TO SYSTEMS AND TESTING APPROACHES<\/strong>[\/vc_column_text][\/vc_column][\/vc_row]\n[vc_row][vc_column width=”1\/4″][vc_column_text]10:35 AM[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text]SESSION INTRODUCTION<\/strong>
Chair: Almudena Lindoso (University Carlos III Madrid)[\/vc_column_text][\/vc_column][\/vc_row]\n[vc_row][vc_column width=”1\/4″][vc_column_text]G-1<\/strong>
10:40 AM[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text]\n

Pulsed Electrons: A Method for Inducing Ion-like Single-Event Transients and Latchup<\/strong><\/p>\n

G. Tzintzarov1<\/sup>, J. Teng1<\/sup>, A. Kulkarni2<\/sup>, S. Brian2<\/sup>, P. Musumeci2<\/sup>, A. Bushmaker1<\/sup>, S. Milton3<\/sup>, R. Berry4<\/sup>, G. Allen5<\/sup><\/p>\n

1. The Aerospace Corporation, USA   2. University of California, USA   3. TAU Systems, USA   4. RadiaBeam Technologies, USA   5. NASA Jet Propulsion Laboratory, USA<\/p>\n

Development of SEE testing using pulsed electrons is discussed. SET correlation in a photodiode is achieved and SEL testing in a COTS part is discussed. Results support the use of such beams for RHA testing.<\/p>\n[\/vc_column_text][\/vc_column][\/vc_row]\n[vc_row][vc_column width=”1\/4″][vc_column_text]G-2<\/strong>
10:55 AM[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text]\n

Data Sanitization of Aged SRAM Array using Ionizing Radiation<\/strong><\/p>\n

A. Stephen Vellankanni1<\/sup>, I. Chatterjee2<\/sup>, U. Guin3<\/sup>, B. Ray1<\/sup><\/p>\n

1. Colorado State University, USA   2. Airbus Defence and Space, Germany   3. Auburn University, USA<\/p>\n

We demonstrate a TID-based data sanitization technique for aged SRAM, achieving near- complete removal of aging-induced data imprints after 100 krad(Si), and provide a root- cause analysis of the underlying physical mechanisms.<\/p>\n[\/vc_column_text][\/vc_column][\/vc_row]\n[vc_row][vc_column width=”1\/4″][vc_column_text]G-3<\/strong>
11:10 AM[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text]\n

Improved Methods for Thermal Neutron SEE Testing and Evaluation<\/strong><\/p>\n

R. Zedric1<\/sup>, N. Dodds1<\/sup>, J. Joffrion1<\/sup>, Y. Xiong1<\/sup>, A. Tonigan1<\/sup><\/p>\n

1. Sandia National Laboratories, USA<\/p>\n

Evidence is presented that suggests the international standard for thermal neutron SEE testing contains an error that causes the calculated cross sections to be artificially low. The impacts are quantified, and the formula is corrected.<\/p>\n[\/vc_column_text][\/vc_column][\/vc_row]\n[vc_row][vc_column width=”1\/4″][vc_column_text]G-4<\/strong>
9:30 AM[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text]\n

Predicting the Location of Heavy-Ion Interactions within Analog Components<\/strong><\/p>\n

J. Carpenter1<\/sup>, T. Peyton1<\/sup>, J. Hales2<\/sup>, T. Crane2<\/sup>, D. McMorrow2<\/sup>, M. McKinney1<\/sup>, J. Lazenby1<\/sup>, D. Loveless1<\/sup>, A. Ildefonso1<\/sup><\/p>\n

1. Indiana University, USA   2. U.S. Naval Research Laboratory, USA<\/p>\n

Distance-based hierarchical clustering links heavy-ion SETs to spatially encoded pulsed- laser libraries, enabling the prediction of interaction locations in a COTS operational amplifier. Topside SPA validates clustering confidence, enabling accurate spatial mapping of heavy-ion-sensitive nodes.<\/p>\n[\/vc_column_text][\/vc_column][\/vc_row]\n[vc_row][vc_column width=”1\/4″][vc_column_text]G-5<\/strong>
9:45 AM[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text]\n

Estimating SEU Cross-Sections in Single-Port and Two-Port SRAMs Using Data Retention Voltage Measurements<\/strong><\/p>\n

S. Tolson1<\/sup>, X. Zhao1<\/sup>, J. Kronenberg1<\/sup>, N. Pieper1<\/sup>, Y. Xiong1<\/sup>, B. Bhuva1<\/sup><\/p>\n

1. Vanderbilt University, USA<\/p>\n

SEU cross-sections of single-port and two-port SRAMs fabricated in a commercial 3-nm bulk FinFET technology node process are estimated using data retention voltage measurements, a simple measure of an SRAM cell\u2019s stability.<\/p>\n[\/vc_column_text][\/vc_column][\/vc_row]\n[vc_row][vc_column width=”1\/4″][vc_column_text]G-6<\/strong>
10:00 AM[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text]\n

FlipFlop architecture effect on GEO error rate for FinFET 3-nm node<\/strong><\/p>\n

G. Gasiot1<\/sup>, S. El Hajji1<\/sup>, T. Thery1<\/sup>, V. Correas1<\/sup>, V. Malherbe1<\/sup>, Y. Xiong2<\/sup>, N. Pieper2<\/sup>, J. Kronenberg2<\/sup>, J-L. Autran3<\/sup>, B. Bhuva2<\/sup>, D. Pandini4<\/sup>, P. Roche1<\/sup><\/p>\n

1. STMicroelectronics, France   2. Vanderbilt University, USA   3. Institut de Physique de Rennes, France   4. STMicroelectronics, Italy<\/p>\n

Once validated an industrial Monte Carlo modeling tool is used to explore the error rate response of several Flip Flop designs in 3-nm FinFETs to help designers in selecting the best ones for their needs.<\/p>\n[\/vc_column_text][\/vc_column][\/vc_row]\n[vc_row][vc_column][vc_column_text]\n

POSTER SESSION G<\/strong><\/h2>\n[\/vc_column_text][\/vc_column][\/vc_row]\n[vc_row][vc_column width=”1\/4″][vc_column_text]PG-1<\/strong>[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text]\n

Variability Analysis of TID-Induced Failure in a Complex Microcontroller<\/strong><\/p>\n

I. Hudson1<\/sup>, H. Hunnicutt1<\/sup>, D. Loveless1<\/sup><\/p>\n

1. Indiana University, USA<\/p>\n

Inter-device variability in TID-induced functional failure was observed across forty-six MSP430FR6989 microcontroller units. A combination of programmable bias and the internal VLO oscillator\u2019s baseline behavior is shown to be predictive of the failure dose.<\/p>\n[\/vc_column_text][\/vc_column][\/vc_row]\n[vc_row][vc_column width=”1\/4″][vc_column_text]PG-2<\/strong>[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text]\n

Benchtop Emulation of System-Level Analog Single-Event Transients from Piece-Part Data<\/strong><\/p>\n

M. McKinney1<\/sup>, C. James1<\/sup>, T. Peyton1<\/sup>, H. Hunnicutt1<\/sup>, D. Loveless1<\/sup><\/p>\n

1. Indiana University, USA<\/p>\n

A board-level ASET emulation methodology is demonstrated by comparing heavy-ion\u2013 induced transients in a linear voltage regulator with emulated responses derived from measured piece-part SETs, enabling system verification with reduced radiation testing.<\/p>\n[\/vc_column_text][\/vc_column][\/vc_row]\n[vc_row][vc_column width=”1\/4″][vc_column_text]PG-3<\/strong>[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text]\n

Electron Pulses Generated by Compact Laser-Plasma Accelerators as Surrogates for Heavy Ions in Single Event Effect Testing<\/strong><\/p>\n

M. Hu1<\/sup>, J. Trippe1<\/sup>, D. Ball1<\/sup>, A. Sternberg1<\/sup>, B. Sierawski1<\/sup>, M. Solt2<\/sup>, J. Thieman2<\/sup>, S. Schroeder3<\/sup>, J. Van Tilborg3<\/sup>, J. Matson2<\/sup>, J. Warner2<\/sup>, B. Dorney2<\/sup>, R. Jacob3<\/sup>, C. Berger3<\/sup>, B. Greenwood3<\/sup>, S. Barber3<\/sup>, R. Reed1<\/sup>, D. Fleetwood1<\/sup>, S. Wolin2<\/sup>, K. Nagamatsu2<\/sup>, M. McLain2<\/sup><\/p>\n

1. Vanderbilt University, USA   2. Northrop Grumman, USA   3. Lawrence Berkeley National Laboratory, USA<\/p>\n

Laser-plasma accelerated electron bunches are investigated as surrogates for heavy ion testing of single event effects in microelectronics. Experimental data and high-fidelity simulations show that microelectronic responses to electron bunches can mimic heavy ions.<\/p>\n[\/vc_column_text][\/vc_column][\/vc_row]\n[vc_row][vc_column width=”1\/4″][vc_column_text]PG-4<\/strong>[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text]\n

Augmenting Pulsed-Laser Latchup Screening Process with SEL Historical Data Model<\/strong><\/p>\n

J. Warner1<\/sup>, S. Messenger1<\/sup>, B. Song1<\/sup>, J. Rodriguez1<\/sup><\/p>\n

1. Northrop Grumman, USA<\/p>\n

Pulsed-laser screening was performed on commercial CMOS devices to estimate the latchup cross-section vs LET curve and historical heavy ion data is used to bound SEL risk.<\/p>\n[\/vc_column_text][\/vc_column][\/vc_row]\n[vc_row][vc_column width=”1\/4″][vc_column_text]PG-5L<\/strong>[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text]\n

Radiation-Resilient In-Memory FFT Computing with Commercial 3D NAND Memories<\/strong><\/p>\n

S. Seo1<\/sup>, S. Kim1<\/sup>, S. Yi2<\/sup>, V. Shastry2<\/sup><\/p>\n

1. University of Rhode Island, USA   2. Texas A&M University, USA<\/p>\n

This work investigates a cross-layer technique to improve the robustness of in-memory computing FFT acceleration under radiation using radiation-soft commercial 3D NAND flash memories for energy-efficient space and edge applications.<\/p>\n[\/vc_column_text][\/vc_column][\/vc_row]\n","protected":false},"excerpt":{"rendered":"

[vc_row][vc_column][vc_column_text] 2026 IEEE NSREC TECHNICAL PROGRAM SESSION G SCHEDULE PUERTO RICO CONVENTION CENTER, SAN JUAN, PR THURSDAY, JULY 23 & FRIDAY, JULY 24, 2026 [\/vc_column_text][\/vc_column][\/vc_row] [vc_row][vc_column width=”1\/4″][vc_column_text]SESSION GBallroom A[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text]HARDNESS ASSURANCE: PIECE PARTS TO SYSTEMS AND TESTING APPROACHES[\/vc_column_text][\/vc_column][\/vc_row] [vc_row][vc_column width=”1\/4″][vc_column_text]10:35 AM[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text]SESSION INTRODUCTIONChair: Almudena Lindoso (University Carlos III Madrid)[\/vc_column_text][\/vc_column][\/vc_row] [vc_row][vc_column width=”1\/4″][vc_column_text]G-110:40 AM[\/vc_column_text][\/vc_column][vc_column width=”3\/4″][vc_column_text] Pulsed Electrons:… Continue reading Technical Program 2026 – Session G<\/span><\/a><\/p>\n","protected":false},"author":2,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"inline_featured_image":false,"footnotes":""},"class_list":["post-8565","page","type-page","status-publish","hentry","entry"],"acf":{"page_header":[{"ID":8749,"post_author":"2","post_date":"2025-09-04 20:34:04","post_date_gmt":"2025-09-04 20:34:04","post_content":"[vc_row][vc_column][vc_empty_space height=\"125px\"][\/vc_column][\/vc_row][vc_row][vc_column width=\"1\/2\"][vc_column_text]\r\n

IEEE Nuclear & Space Radiation Effects Conference<\/h1>\r\n

JULY 20th-24th, 2026<\/h2>\r\n

San Juan, Puerto Rico, USA<\/h2>\r\n[\/vc_column_text][vc_column_text]\r\n
Follow NSREC [nsrec_social_icons]<\/div>\r\n[\/vc_column_text][vc_empty_space height=\"6px\"][vc_btn title=\"NSREC Brochure\" style=\"3d\" color=\"warning\" size=\"sm\" i_icon_fontawesome=\"fas fa-external-link-alt\" css_animation=\"fadeIn\" add_icon=\"true\" link=\"url:https%3A%2F%2Fwww.nsrec.com%2Fwp-content%2F%2Fuploads%2F2026%2F07%2F2026_NSRECBrochure_Final_V2e.pdf|target:_blank\"][vc_empty_space height=\"6px\"][vc_btn title=\"Schedule at a Glance\" style=\"3d\" color=\"inverse\" size=\"sm\" i_icon_fontawesome=\"fas fa-external-link-alt\" css_animation=\"fadeIn\" add_icon=\"true\" link=\"url:https%3A%2F%2Fwww.nsrec.com%2Fschedule-at-a-glance%2F|target:_blank\"][\/vc_column][vc_column width=\"1\/4\"][vc_single_image image=\"8767\" style=\"vc_box_rounded\"][vc_empty_space height=\"16px\"][vc_btn title=\"Chair's Invitation\" color=\"inverse\" link=\"url:https%3A%2F%2Fwww.nsrec.com%2Fwp-content%2F%2Fuploads%2F2025%2F11%2FInvitation-Letter.pdf|title:Chair%E2%80%99s%20Invitation|target:_blank\"][vc_separator][\/vc_column][vc_column width=\"1\/4\"][vc_empty_space height=\"290px\"][vc_btn title=\"Short Course Description\" color=\"danger\" link=\"url:https%3A%2F%2Fwww.nsrec.com%2Fwp-content%2F%2Fuploads%2F2026%2F04%2FNSREC-2026ShortCourse-FLYER_v6-Final.pdf|title:Short%20Course%20Description|target:_blank\"][vc_empty_space height=\"16px\"][vc_btn title=\"Supporter and Exhibitor Registration\" color=\"danger\" link=\"url:https%3A%2F%2Fcvent.me%2FvlPo1L|title:Supporter%20Registration|target:_blank\"][vc_empty_space height=\"16px\"][vc_btn title=\"Hotel Registration\" color=\"warning\" css_animation=\"lightSpeedIn\" link=\"url:https%3A%2F%2Fbook.passkey.com%2Fevent%2F51004057%2Fowner%2F5772432%2Fhome%3Futm_campaign%3D299386963c%26mobile%3Dtrue%26dw%3D414|title:Hotel%20Registration%20|target:_blank\"][vc_empty_space height=\"16px\"][vc_btn title=\"Conference Registration\" color=\"warning\" css_animation=\"lightSpeedIn\" link=\"url:https%3A%2F%2Fcvent.me%2FaW0lgE|title:Conference%20Registration|target:_blank\"][\/vc_column][\/vc_row][vc_row][vc_column][vc_empty_space height=\"16px\"][\/vc_column][\/vc_row][vc_row][vc_column][\/vc_column][\/vc_row]","post_title":"Main Header 2026","post_excerpt":"","post_status":"publish","comment_status":"closed","ping_status":"closed","post_password":"","post_name":"main-header-2026","to_ping":"","pinged":"","post_modified":"2026-07-19 12:34:21","post_modified_gmt":"2026-07-19 12:34:21","post_content_filtered":"","post_parent":0,"guid":"https:\/\/www.nsrec.com\/?post_type=headers&p=8749","menu_order":0,"post_type":"headers","post_mime_type":"","comment_count":"0","filter":"raw"}]},"_links":{"self":[{"href":"https:\/\/www.nsrec.com\/wp-json\/wp\/v2\/pages\/8565","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.nsrec.com\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.nsrec.com\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.nsrec.com\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/www.nsrec.com\/wp-json\/wp\/v2\/comments?post=8565"}],"version-history":[{"count":5,"href":"https:\/\/www.nsrec.com\/wp-json\/wp\/v2\/pages\/8565\/revisions"}],"predecessor-version":[{"id":9322,"href":"https:\/\/www.nsrec.com\/wp-json\/wp\/v2\/pages\/8565\/revisions\/9322"}],"wp:attachment":[{"href":"https:\/\/www.nsrec.com\/wp-json\/wp\/v2\/media?parent=8565"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}