{"id":8803,"date":"2025-09-04T22:19:36","date_gmt":"2025-09-04T22:19:36","guid":{"rendered":"https:\/\/www.nsrec.com\/?page_id=8803"},"modified":"2025-09-04T22:19:50","modified_gmt":"2025-09-04T22:19:50","slug":"technical-program-2026","status":"publish","type":"page","link":"https:\/\/www.nsrec.com\/technical-program-2026\/","title":{"rendered":"Technical Program 2026"},"content":{"rendered":"[vc_row][vc_column width=&#8221;1\/4&#8243;][vc_single_image image=&#8221;8781&#8243; style=&#8221;vc_box_circle_2&#8243;][vc_column_text]<strong>Technical Program Chair<\/strong><br \/>\nSylvain Girard<br \/>\nUniversity St. Etienne<br \/>\n<a class=\"ms-outlook-linkify\" href=\"mailto:sylvain.girard@univ-st-etienne.fr\">sylvain.girard@univ-st-etienne.fr<\/a>[\/vc_column_text][vc_btn title=&#8221;First Call for Papers&#8221; link=&#8221;url:https%3A%2F%2Fwww.nsrec.com%2Fwp-content%2F%2Fuploads%2F2025%2F09%2FNSREC_Call4Papers_First.pdf&#8221;][\/vc_column][vc_column width=&#8221;3\/4&#8243;][vc_column_text]\n<h1>Technical Program<\/h1>\n<p class=\"p1\">You are cordially invited to attend the 2026 IEEE Nuclear and Space Radiation Effects<\/p>\n<p class=\"p1\">Conference to be held July 20-24, 2026 at the Puerto Rico Convention Center, San Juan, Puerto Rico. The conference features a technical program consisting of eight to ten technical sessions of contributed papers describing the latest observations in radiation effects, a Short Course on radiation effects issues, a Radiation Effects Data Workshop, and an Industrial Exhibit. The technical program includes oral and poster sessions. Papers on nuclear and space radiation effects on electronic and photonic materials, devices, circuits, sensors, and systems, as well as semiconductor processing technology and design techniques for producing radiation-tolerant (hardened) devices and integrated circuits, will be presented at this meeting of engineers, scientists, and managers. International participation is strongly encouraged. We are soliciting papers describing significant new findings in the following or related areas:<\/p>\n<p class=\"p3\"><b>Basic Mechanisms of Radiation Effects in Electronic Materials and Devices <\/b><\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Single-Event Charge Collection Phenomena and Mechanisms<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Ionizing Radiation Effects<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Displacement Damage<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Radiation Transport, Energy Deposition, and Dosimetry<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Materials and Device Effects<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Processing Related Radiation Effects<\/p>\n<p class=\"p3\"><b>Hardness Assurance Covering Piece Parts, Systems, and Testing Approaches <\/b><\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>New Modeling and Testing Techniques, Guidelines, and Hardness Assurance Methodologies<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Unique Radiation Exposure Facilities, Test Facility Developments, Novel Instrumentation Methods<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Dosimetry<\/p>\n<p class=\"p3\"><b>Radiation Effects on Electronic and Photonic Devices, Circuits, and Systems <\/b><\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Single Event Effects, Total Dose, and Displacement Damage<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>MOS, Bipolar, and Advanced Technologies<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Systems on a Chip, GPUs, FPGAs, Microprocessors, and Neuromorphic Devices<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Isolation Technologies, such as SOI and SOS<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Methods for Hardened Design and Manufacturing<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Modeling and Hardening of Devices and Circuits<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Cryogenic or High Temperature Effects<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Novel Device Structures, such as MEMS and Nanotechnologies<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Emerging Modeling and Experimental Techniques for Hardening Systems<\/p>\n<p class=\"p3\"><b>Space, Atmospheric, and Terrestrial Radiation Effects <\/b><\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Characterization and Modeling of Radiation Environments<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Space Weather Events and Effects<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Spacecraft Surface and Internal Charging<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Predicting and Verifying Soft Error Rates (SER)<\/p>\n<p class=\"p3\"><b>New Developments of Interest to the Radiation Effects Community <\/b><\/p>\n[\/vc_column_text][\/vc_column][\/vc_row][vc_row disable_element=&#8221;yes&#8221;][vc_column width=&#8221;1\/4&#8243;][vc_column_text]\n<div class=\"page\" title=\"Page 9\">\n<div class=\"layoutArea\">\n<div class=\"column\">\n<h2>Submission Timeline<\/h2>\n<\/div>\n<\/div>\n<\/div>\n[\/vc_column_text][\/vc_column][vc_column width=&#8221;3\/4&#8243;][vc_column_text]\n<div class=\"page\" title=\"Page 9\">\n<div class=\"layoutArea\">\n<div class=\"column\">\n<div class=\"page\" title=\"Page 1\">\n<div class=\"layoutArea\">\n<div class=\"column\">\n<p style=\"font-weight: 400;\"><strong>Technical abstracts are due on Friday, February 2, 2024.<\/strong> The abstract submission link will open on Saturday, December 9, 2023. Please note: Late News abstracts will be submitted during a one-month window in April and May 2024.<\/p>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n[\/vc_column_text][\/vc_column][\/vc_row][vc_row disable_element=&#8221;yes&#8221;][vc_column width=&#8221;1\/4&#8243;][vc_column_text]\n<div class=\"page\" title=\"Page 9\">\n<div class=\"layoutArea\">\n<div class=\"column\">\n<h2 style=\"font-weight: 400;\"><strong>POSTER SESSION<\/strong><\/h2>\n<\/div>\n<\/div>\n<\/div>\n[\/vc_column_text][\/vc_column][vc_column width=&#8221;3\/4&#8243;][vc_column_text]\n<p style=\"font-weight: 400;\">Those papers that can be presented more effectively in a visual format with group discussion will be displayed in the Poster Session. Posters can be viewed during the week, and authors will be available during the Poster Session (date TBA). The Poster Session is chaired by Daisuke Kobayashi from JAXA.<\/p>\n[\/vc_column_text][\/vc_column][\/vc_row][vc_row disable_element=&#8221;yes&#8221;][vc_column width=&#8221;1\/4&#8243;][vc_column_text]\n<div class=\"page\" title=\"Page 9\">\n<div class=\"layoutArea\">\n<div class=\"column\">\n<h2 style=\"font-weight: 400;\"><strong>DATA WORKSHOP<\/strong><\/h2>\n<\/div>\n<\/div>\n<\/div>\n[\/vc_column_text][\/vc_column][vc_column width=&#8221;3\/4&#8243;][vc_column_text]\n<p style=\"font-weight: 400;\">Workshop papers provide piece part radiation response data and radiation test facilities technical information. Workshop papers can be viewed during the week, and authors will be available during the Workshop Session (date TBA). The Data Workshop is chaired by Li Chen from the University of Saskatchewan.<\/p>\n[\/vc_column_text][\/vc_column][\/vc_row][vc_row disable_element=&#8221;yes&#8221;][vc_column width=&#8221;1\/4&#8243;][vc_column_text]\n<div class=\"page\" title=\"Page 9\">\n<div class=\"layoutArea\">\n<div class=\"column\">\n<h2 style=\"font-weight: 400;\"><strong>INVITED SPEAKERS<\/strong><\/h2>\n<\/div>\n<\/div>\n<\/div>\n[\/vc_column_text][\/vc_column][vc_column width=&#8221;3\/4&#8243;][vc_column_text]\n<p style=\"font-weight: 400;\">NSREC 2024 will have three guest speakers through the week.<\/p>\n[\/vc_column_text][\/vc_column][\/vc_row][vc_row disable_element=&#8221;yes&#8221;][vc_column width=&#8221;1\/4&#8243;][vc_column_text]\n<div class=\"page\" title=\"Page 9\">\n<div class=\"layoutArea\">\n<div class=\"column\">\n<div class=\"page\" title=\"Page 9\">\n<div class=\"layoutArea\">\n<div class=\"column\">\n<h2>MELD Meeting<\/h2>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n[\/vc_column_text][\/vc_column][vc_column width=&#8221;3\/4&#8243;][vc_column_text]\n<div class=\"page\" title=\"Page 9\">\n<div class=\"layoutArea\">\n<div class=\"column\">\n<div class=\"page\" title=\"Page 9\">\n<div class=\"layoutArea\">\n<div class=\"column\">\n<div class=\"page\" title=\"Page 1\">\n<div class=\"layoutArea\">\n<div class=\"column\">\n<p style=\"font-weight: 400;\">The meld meeting is where all abstract decisions are made, including session assignment, presentation format (e.g., oral or poster), and in what order they will be presented. The final program schedule is also determined at the meld meeting. Required attendees include the Technical Program Chair, the Poster Chair, the Data Workshop Chair, all the session chairs, and the Vice-Chair for Publications. Other attendees are at the discretion of the Technical Program Chair and often include the Conference Chair, the IEEE Transactions on Nuclear Science senior editor for radiation effects, and the following year\u2019s Technical Program Chair. All proceedings at the meld meeting are confidential.<\/p>\n<p style=\"font-weight: 400;\">The meld meeting will be held in Washington, DC on March 14-15, 2023. The short course dry run will be conducted on March 16, 2023, following completion of meld meeting activities.<\/p>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n[\/vc_column_text][\/vc_column][\/vc_row][vc_row disable_element=&#8221;yes&#8221;][vc_column width=&#8221;1\/4&#8243;][vc_column_text]\n<div class=\"page\" title=\"Page 9\">\n<div class=\"layoutArea\">\n<div class=\"column\">\n<div class=\"page\" title=\"Page 9\">\n<div class=\"layoutArea\">\n<div class=\"column\">\n<div class=\"page\" title=\"Page 3\">\n<div class=\"layoutArea\">\n<div class=\"column\">\n<h2>WED. JULY 26, 2023 11:30 AM TO 1:00 PM<\/h2>\n<h2>IEEE YOUNG PROFESSIONALS LUNCHEON<\/h2>\n<h2>CHOUTEAU<\/h2>\n<h2><strong><i style=\"font-family: var(--heading--font-family); font-size: var(--heading--font-size-h3); letter-spacing: var(--heading--letter-spacing-h3); color: var(--global--color-primary);\">Ticket Required to Attend<\/i><\/strong><\/h2>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n[\/vc_column_text][\/vc_column][vc_column width=&#8221;3\/4&#8243;][vc_column_text]\n<div class=\"page\" title=\"Page 9\">\n<div class=\"layoutArea\">\n<div class=\"column\">\n<div class=\"page\" title=\"Page 9\">\n<div class=\"layoutArea\">\n<div class=\"column\">\n<div class=\"page\" title=\"Page 1\">\n<div class=\"layoutArea\">\n<div class=\"column\">\n<div class=\"page\" title=\"Page 3\">\n<div class=\"layoutArea\">\n<div class=\"column\">\n<p>A special lunch will be held in the Chouteau room for IEEE member attendees who are Young Professionals (http:\/\/yp.ieee.org\/, https:\/\/www.facebook.com\/ieeeyp).<\/p>\n<p>This year, we will be specifically looking to hear your inputs, whether they are new experiences, lessons learned, lessons not learned, plans, successes, and even failures related to radiation effects in your career. This is an excellent opportunity for newer members of the community to informally chat, network, eat lunch, and share their visions of the radiation effects field looking forward. There\u2019s no requirement to participate openly, and a few brief, anonymous questions followed by a moderated discussion will address the following topics:<\/p>\n<p><strong>Workforce Development<\/strong><\/p>\n<p>Let\u2019s turn the tables of workforce development and hear from the youngest employees. What\u2019s actually working in your organization? What are we missing that other young professionals need to succeed?<\/p>\n<p><strong>Engineering Resources<\/strong><\/p>\n<p>It\u2019s time to discuss practical, on-the-job matters. Where can the field improve its engineering quality? How can we do our jobs better?<\/p>\n<p><strong>Radiation Effects Knowledge Transfer<\/strong><\/p>\n<p>Many esteemed radiation effects engineers with a lifetime of experience have developed a wealth of knowledge as the field itself evolved. How well is that knowledge spreading in your organization? Who is successfully learning on the job, and where can we do a better job of passing down the skills of the trade?<\/p>\n<p>Don\u2019t miss your opportunity to have your voice heard, meet new friends, and learn something new at the Young Professionals\u2019 lunch. Tickets are required.<\/p>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n[\/vc_column_text][\/vc_column][\/vc_row][vc_row disable_element=&#8221;yes&#8221;][vc_column width=&#8221;1\/4&#8243;][vc_column_text]\n<div class=\"page\" title=\"Page 9\">\n<div class=\"layoutArea\">\n<div class=\"column\">\n<div class=\"page\" title=\"Page 9\">\n<div class=\"layoutArea\">\n<div class=\"column\">\n<div class=\"page\" title=\"Page 3\">\n<div class=\"layoutArea\">\n<div class=\"column\">\n<div class=\"page\" title=\"Page 4\">\n<div class=\"layoutArea\">\n<div class=\"column\">\n<h2>THURSDAY, JULY 27, 2023 11:30 AM TO 1:15 PM<\/h2>\n<h2>WOMEN IN ENGINEERING LUNCHEON<\/h2>\n<h2>CHOUTEAU<\/h2>\n<\/div>\n<\/div>\n<\/div>\n<h2><strong><i style=\"font-family: var(--heading--font-family); font-size: var(--heading--font-size-h3); letter-spacing: var(--heading--letter-spacing-h3); color: var(--global--color-primary);\">Ticket Required to Attend<\/i><\/strong><\/h2>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n[\/vc_column_text][\/vc_column][vc_column width=&#8221;3\/4&#8243;][vc_column_text]\n<div class=\"page\" title=\"Page 9\">\n<div class=\"layoutArea\">\n<div class=\"column\">\n<div class=\"page\" title=\"Page 9\">\n<div class=\"layoutArea\">\n<div class=\"column\">\n<div class=\"page\" title=\"Page 1\">\n<div class=\"layoutArea\">\n<div class=\"column\">\n<div class=\"page\" title=\"Page 3\">\n<div class=\"layoutArea\">\n<div class=\"column\">\n<div class=\"page\" title=\"Page 4\">\n<div class=\"layoutArea\">\n<div class=\"column\">\n<p>A special lunch will be held in the Chouteau room for Women in Engineering and is sponsored by the IEEE NPSS society. This event is open to all attendees who are interested in discussing women\u2019s issues in engineering and other related career fields. This year&#8217;s speaker is Marti McCurdy, Spirit Electronics CEO. She will be speaking\u00a0on the topic &#8220;Lessons Learned from the Barnyard to the Board Room&#8221;.<\/p>\n<p>Talk write-up: Growing up in Central Pennsylvania\u2019s Amish community has provided the ground work to be strong willed, resilient to a fault, and run the most award- winning small distribution channel for the Prime Defense contractors and Space Companies in the US. This talk will discuss lessons learned from six years in the Air Force and how it has prepared me for running companies as diverse as a motorcycle shop to patenting a child safety car seat alarm and the effects of being in proximity\u00a0to technology helped foster the direction of a career in semiconductors. Spanning decades, lessons learned never expire, they continue to deepen and expand with the challenges facing today\u2019s business environment.<\/p>\n<p>Speaker bio: Marti McCurdy, CEO of Spirit Electronics, is a veteran not only of the semiconductor business but also a veteran of the United States Air Force. Marti\u2019s career has been an entrepreneurial path that has driven her to start and run multiple companies. Marti acquired Spirit Electronics in September 2017, a distribution company serving military and space contractors. Marti\u2019s focus as CEO at Spirit Electronics is to offer product plus value add, turnkey solutions to the aerospace<br \/>\nand defense industry for high reliability components. She exercises her engineering knowledge of space qualified flows and sophisticated testing to deliver space qualified components. Throughout her career as a business owner and past positions as VP, Marti\u2019s goal is to bring her high standard of customer service and cultivate relationships to serve the aerospace sector she is so familiar with. Marti holds a current patent and is a published author in ultrasonic applications.<\/p>\n<p><em>Note: Tickets are required so check the box for this lunch when you register for the conference.<\/em><\/p>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n[\/vc_column_text][\/vc_column][\/vc_row]\n","protected":false},"excerpt":{"rendered":"<p>[vc_row][vc_column width=&#8221;1\/4&#8243;][vc_single_image image=&#8221;8781&#8243; style=&#8221;vc_box_circle_2&#8243;][vc_column_text]Technical Program Chair Sylvain Girard University St. Etienne sylvain.girard@univ-st-etienne.fr[\/vc_column_text][vc_btn title=&#8221;First Call for Papers&#8221; link=&#8221;url:https%3A%2F%2Fwww.nsrec.com%2Fwp-content%2F%2Fuploads%2F2025%2F09%2FNSREC_Call4Papers_First.pdf&#8221;][\/vc_column][vc_column width=&#8221;3\/4&#8243;][vc_column_text] Technical Program You are cordially invited to attend the 2026 IEEE Nuclear and Space Radiation Effects Conference to be held July 20-24, 2026 at the Puerto Rico Convention Center, San Juan, Puerto Rico. The conference features a&hellip; <a class=\"more-link\" href=\"https:\/\/www.nsrec.com\/technical-program-2026\/\">Continue reading <span class=\"screen-reader-text\">Technical Program 2026<\/span><\/a><\/p>\n","protected":false},"author":2,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"inline_featured_image":false,"footnotes":""},"class_list":["post-8803","page","type-page","status-publish","hentry","entry"],"acf":{"page_header":[{"ID":8749,"post_author":"2","post_date":"2025-09-04 20:34:04","post_date_gmt":"2025-09-04 20:34:04","post_content":"[vc_row][vc_column][vc_empty_space height=\"125px\"][\/vc_column][\/vc_row][vc_row][vc_column width=\"1\/2\"][vc_column_text]\r\n<h1>IEEE Nuclear &amp; Space Radiation Effects Conference<\/h1>\r\n<h2>JULY 20th-24th, 2026<\/h2>\r\n<h2>San Juan, Puerto Rico, USA<\/h2>\r\n[\/vc_column_text][vc_column_text]\r\n<div class=\"follow-nsrec-wrap\">Follow NSREC [nsrec_social_icons]<\/div>\r\n[\/vc_column_text][vc_empty_space height=\"6px\"][vc_btn title=\"NSREC Brochure\" style=\"3d\" color=\"warning\" size=\"sm\" i_icon_fontawesome=\"fas fa-external-link-alt\" css_animation=\"fadeIn\" add_icon=\"true\" link=\"url:https%3A%2F%2Fwww.nsrec.com%2Fwp-content%2F%2Fuploads%2F2026%2F07%2F2026_NSRECBrochure_Final_V2e.pdf|target:_blank\"][vc_empty_space height=\"6px\"][vc_btn title=\"Schedule at a Glance\" style=\"3d\" color=\"inverse\" size=\"sm\" i_icon_fontawesome=\"fas fa-external-link-alt\" css_animation=\"fadeIn\" add_icon=\"true\" link=\"url:https%3A%2F%2Fwww.nsrec.com%2Fschedule-at-a-glance%2F|target:_blank\"][\/vc_column][vc_column width=\"1\/4\"][vc_single_image image=\"8767\" style=\"vc_box_rounded\"][vc_empty_space height=\"16px\"][vc_btn title=\"Chair's Invitation\" color=\"inverse\" link=\"url:https%3A%2F%2Fwww.nsrec.com%2Fwp-content%2F%2Fuploads%2F2025%2F11%2FInvitation-Letter.pdf|title:Chair%E2%80%99s%20Invitation|target:_blank\"][vc_separator][\/vc_column][vc_column width=\"1\/4\"][vc_empty_space height=\"290px\"][vc_btn title=\"Short Course Description\" color=\"danger\" link=\"url:https%3A%2F%2Fwww.nsrec.com%2Fwp-content%2F%2Fuploads%2F2026%2F04%2FNSREC-2026ShortCourse-FLYER_v6-Final.pdf|title:Short%20Course%20Description|target:_blank\"][vc_empty_space height=\"16px\"][vc_btn title=\"Supporter and Exhibitor Registration\" color=\"danger\" link=\"url:https%3A%2F%2Fcvent.me%2FvlPo1L|title:Supporter%20Registration|target:_blank\"][vc_empty_space height=\"16px\"][vc_btn title=\"Hotel Registration\" color=\"warning\" css_animation=\"lightSpeedIn\" link=\"url:https%3A%2F%2Fbook.passkey.com%2Fevent%2F51004057%2Fowner%2F5772432%2Fhome%3Futm_campaign%3D299386963c%26mobile%3Dtrue%26dw%3D414|title:Hotel%20Registration%20|target:_blank\"][vc_empty_space height=\"16px\"][vc_btn title=\"Conference Registration\" color=\"warning\" css_animation=\"lightSpeedIn\" link=\"url:https%3A%2F%2Fcvent.me%2FaW0lgE|title:Conference%20Registration|target:_blank\"][\/vc_column][\/vc_row][vc_row][vc_column][vc_empty_space height=\"16px\"][\/vc_column][\/vc_row][vc_row][vc_column][\/vc_column][\/vc_row]","post_title":"Main Header 2026","post_excerpt":"","post_status":"publish","comment_status":"closed","ping_status":"closed","post_password":"","post_name":"main-header-2026","to_ping":"","pinged":"","post_modified":"2026-07-19 12:34:21","post_modified_gmt":"2026-07-19 12:34:21","post_content_filtered":"","post_parent":0,"guid":"https:\/\/www.nsrec.com\/?post_type=headers&#038;p=8749","menu_order":0,"post_type":"headers","post_mime_type":"","comment_count":"0","filter":"raw"}]},"_links":{"self":[{"href":"https:\/\/www.nsrec.com\/wp-json\/wp\/v2\/pages\/8803","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.nsrec.com\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.nsrec.com\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.nsrec.com\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/www.nsrec.com\/wp-json\/wp\/v2\/comments?post=8803"}],"version-history":[{"count":1,"href":"https:\/\/www.nsrec.com\/wp-json\/wp\/v2\/pages\/8803\/revisions"}],"predecessor-version":[{"id":8804,"href":"https:\/\/www.nsrec.com\/wp-json\/wp\/v2\/pages\/8803\/revisions\/8804"}],"wp:attachment":[{"href":"https:\/\/www.nsrec.com\/wp-json\/wp\/v2\/media?parent=8803"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}