{"id":8806,"date":"2025-09-04T22:24:15","date_gmt":"2025-09-04T22:24:15","guid":{"rendered":"https:\/\/www.nsrec.com\/?page_id=8806"},"modified":"2025-12-16T00:05:11","modified_gmt":"2025-12-16T00:05:11","slug":"call-for-papers-2026","status":"publish","type":"page","link":"https:\/\/www.nsrec.com\/call-for-papers-2026\/","title":{"rendered":"Call for Papers 2026"},"content":{"rendered":"[vc_row][vc_column][vc_column_text]\n<h1 style=\"text-align: center;\">Call for Papers<\/h1>\n[\/vc_column_text][\/vc_column][\/vc_row][vc_row][vc_column][vc_btn title=&#8221;Download First Call for Papers&#8221; style=&#8221;flat&#8221; link=&#8221;url:https%3A%2F%2Fwww.nsrec.com%2Fwp-content%2F%2Fuploads%2F2025%2F09%2FNSREC_Call4Papers_First.pdf|target:_blank&#8221;][\/vc_column][\/vc_row][vc_row][vc_column][vc_column_text]\n<h2>Watch Our NSREC Now Video on How to Prepare a Strong Summary<\/h2>\n<p>&nbsp;<\/p>\n<p><iframe loading=\"lazy\" title=\"YouTube video player\" src=\"https:\/\/www.youtube.com\/embed\/bbHNPofpmMs\" width=\"560\" height=\"315\" frameborder=\"0\" allowfullscreen=\"allowfullscreen\"><\/iframe>[\/vc_column_text][\/vc_column][vc_column][vc_column_text]Find the IEEE Manuscript Template <a href=\"https:\/\/www.ieee.org\/conferences\/publishing\/templates\">here<\/a>.[\/vc_column_text][\/vc_column][\/vc_row][vc_row][vc_column][vc_column_text]\n<h4>We are soliciting papers describing significant new findings in the following or related areas:<\/h4>\n<p class=\"p3\"><b>Basic Mechanisms of Radiation Effects in Electronic Materials and Devices <\/b><\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Single-Event Charge Collection Phenomena and Mechanisms<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Ionizing Radiation Effects<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Displacement Damage<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Radiation Transport, Energy Deposition, and Dosimetry<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Materials and Device Effects<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Processing Related Radiation Effects<\/p>\n<p class=\"p3\"><b>Hardness Assurance Covering Piece Parts, Systems, and Testing Approaches <\/b><\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>New Modeling and Testing Techniques, Guidelines, and Hardness Assurance Methodologies<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Unique Radiation Exposure Facilities, Test Facility Developments, Novel Instrumentation Methods<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Dosimetry<\/p>\n<p class=\"p3\"><b>Radiation Effects on Electronic and Photonic Devices, Circuits, and Systems <\/b><\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Single Event Effects, Total Dose, and Displacement Damage<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>MOS, Bipolar, and Advanced Technologies<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Systems on a Chip, GPUs, FPGAs, Microprocessors, and Neuromorphic Devices<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Isolation Technologies, such as SOI and SOS<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Methods for Hardened Design and Manufacturing<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Modeling and Hardening of Devices and Circuits<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Cryogenic or High Temperature Effects<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Novel Device Structures, such as MEMS and Nanotechnologies<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Emerging Modeling and Experimental Techniques for Hardening Systems<\/p>\n<p class=\"p3\"><b>Space, Atmospheric, and Terrestrial Radiation Effects <\/b><\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Characterization and Modeling of Radiation Environments<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Space Weather Events and Effects<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Spacecraft Surface and Internal Charging<\/p>\n<p class=\"p3\"><span class=\"s2\">\u25a0 <\/span>Predicting and Verifying Soft Error Rates (SER)<\/p>\n<p class=\"p3\"><b>New Developments of Interest to the Radiation Effects Community <\/b><\/p>\n<p><span style=\"font-family: var(--heading--font-family); font-size: var(--heading--font-size-h4); font-weight: var(--heading--font-weight-strong); letter-spacing: var(--heading--letter-spacing-h4); background-color: var(--global--color-background); color: var(--global--color-primary);\">Data Workshop<\/span><\/p>\n<div class=\"page\" title=\"Page 2\">\n<div class=\"layoutArea\">\n<div class=\"column\">\n<p>The Radiation Effects Data Workshop is a forum for papers on radiation effects data on electronic devices and systems. Workshop papers are intended to provide radiation response data to scientists and engineers who use electronic devices in a radiation environment, and for designers of radiation-hardened systems. Papers describing new simulation or radiation facilities are also welcomed.<\/p>\n<\/div>\n<\/div>\n<\/div>\n[\/vc_column_text][\/vc_column][\/vc_row][vc_row][vc_column width=&#8221;1\/4&#8243;][vc_cta h2=&#8221;Summaries must be received by February 6, 2026&#8243; h2_font_container=&#8221;tag:h3|text_align:left&#8221; style=&#8221;3d&#8221; use_custom_fonts_h2=&#8221;true&#8221;]\n<div class=\"page\" title=\"Page 2\">\n<div class=\"section\">\n<div class=\"layoutArea\">\n<div class=\"column\">\n<p>Detailed submission and formatting instructions will be available after December 1, 2025 at <a href=\"http:\/\/www.nsrec.com\">www.nsrec.com<\/a><\/p>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n[\/vc_cta][\/vc_column][vc_column width=&#8221;3\/4&#8243;][vc_column_text]\n<p style=\"text-align: center;\"><u><strong>Procedure for Submitting Summaries<\/strong><\/u><\/p>\n<p>Authors must conform to the following requirements:<\/p>\n<ol>\n<li>Prepare a single Adobe Acrobat file consisting of a cover page and an informative two to four page summary describing results appropriate for a 12-minute talk or poster presentation. The cover page must provide an abstract no longer than 35 words, the title, name and company affiliation of the authors, and company address (city, state, country). Identify the author presenting the paper and provide telephone, fax, and email address. The summary must include sufficient detail about the work to permit a meaningful technical review. In the summary, clearly indicate (a) the purpose of your work, (b) significant new results with supporting technical material, and (c) how your work advances the state of the art. Show key references to other related work. The summary must be no less than two and no more than four pages in length, including figures and tables. All figures and tables must be large enough to be clearly read. Note that this is more than an abstract, but do not exceed four pages.<\/li>\n<li>Prepare your summary in single-column or IEEE Transactions on Nuclear Science standard two-column format, using 11 point or greater font size, formatted for either U.S. Standard (8.5 x 11 inch) or A4 (21 x 29.7 cm) page layout, with 1 inch (2.5 cm) margins on all four sides.<\/li>\n<li>Obtain all corporate, sponsor, and government approvals and releases necessary for presenting your paper at an open attendance international meeting.<\/li>\n<li>Summary submission is electronic only, through www.nsrec.com. The submission process consists of entering the paper\u00a0title, author(s) and affiliation(s), an abstract no longer than 35 words, and uploading the summary. Authors are prompted to\u00a0state their preference for presentation (oral, poster, or data workshop poster) and for session. Details of the submission process\u00a0may be found at www.nsrec.com. The final category of all papers will be determined by the Technical Program Committee,\u00a0which is responsible for selecting final papers from initial submissions.<\/li>\n<\/ol>\n<p>Papers accepted for oral or poster presentation at the technical program are expected to be submitted for publication in the IEEE Transactions on Nuclear Science (January 2026). Selection for this issue will be based on a separate submission of a complete paper. These papers will be subject to the standard full peer review given all papers submitted to the IEEE Transactions on Nuclear Science. Further information will be sent to prospective authors upon acceptance of their NSREC summary. It is not necessary to be an IEEE member to present a paper or attend the NSREC. However, we encourage IEEE and NPSS membership of all NSREC participants.[\/vc_column_text][\/vc_column][\/vc_row]\n","protected":false},"excerpt":{"rendered":"<p>[vc_row][vc_column][vc_column_text] Call for Papers [\/vc_column_text][\/vc_column][\/vc_row][vc_row][vc_column][vc_btn title=&#8221;Download First Call for Papers&#8221; style=&#8221;flat&#8221; link=&#8221;url:https%3A%2F%2Fwww.nsrec.com%2Fwp-content%2F%2Fuploads%2F2025%2F09%2FNSREC_Call4Papers_First.pdf|target:_blank&#8221;][\/vc_column][\/vc_row][vc_row][vc_column][vc_column_text] Watch Our NSREC Now Video on How to Prepare a Strong Summary &nbsp; [\/vc_column_text][\/vc_column][vc_column][vc_column_text]Find the IEEE Manuscript Template here.[\/vc_column_text][\/vc_column][\/vc_row][vc_row][vc_column][vc_column_text] We are soliciting papers describing significant new findings in the following or related areas: Basic Mechanisms of Radiation Effects in Electronic Materials and Devices&hellip; <a class=\"more-link\" href=\"https:\/\/www.nsrec.com\/call-for-papers-2026\/\">Continue reading <span class=\"screen-reader-text\">Call for Papers 2026<\/span><\/a><\/p>\n","protected":false},"author":2,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"inline_featured_image":false,"footnotes":""},"class_list":["post-8806","page","type-page","status-publish","hentry","entry"],"acf":{"page_header":[{"ID":8749,"post_author":"2","post_date":"2025-09-04 20:34:04","post_date_gmt":"2025-09-04 20:34:04","post_content":"[vc_row][vc_column][vc_empty_space height=\"125px\"][\/vc_column][\/vc_row][vc_row][vc_column width=\"1\/2\"][vc_column_text]\r\n<h1>IEEE Nuclear &amp; Space Radiation Effects Conference<\/h1>\r\n<h2>JULY 20th-24th, 2026<\/h2>\r\n<h2>San Juan, Puerto Rico, USA<\/h2>\r\n[\/vc_column_text][vc_column_text]\r\n<div class=\"follow-nsrec-wrap\">Follow NSREC [nsrec_social_icons]<\/div>\r\n[\/vc_column_text][vc_empty_space height=\"6px\"][vc_btn title=\"NSREC Brochure\" style=\"3d\" color=\"warning\" size=\"sm\" i_icon_fontawesome=\"fas fa-external-link-alt\" css_animation=\"fadeIn\" add_icon=\"true\" link=\"url:https%3A%2F%2Fwww.nsrec.com%2Fwp-content%2F%2Fuploads%2F2026%2F07%2F2026_NSRECBrochure_Final_V2e.pdf|target:_blank\"][vc_empty_space height=\"6px\"][vc_btn title=\"Schedule at a Glance\" style=\"3d\" color=\"inverse\" size=\"sm\" i_icon_fontawesome=\"fas fa-external-link-alt\" css_animation=\"fadeIn\" add_icon=\"true\" link=\"url:https%3A%2F%2Fwww.nsrec.com%2Fschedule-at-a-glance%2F|target:_blank\"][\/vc_column][vc_column width=\"1\/4\"][vc_single_image image=\"8767\" style=\"vc_box_rounded\"][vc_empty_space height=\"16px\"][vc_btn title=\"Chair's Invitation\" color=\"inverse\" link=\"url:https%3A%2F%2Fwww.nsrec.com%2Fwp-content%2F%2Fuploads%2F2025%2F11%2FInvitation-Letter.pdf|title:Chair%E2%80%99s%20Invitation|target:_blank\"][vc_separator][\/vc_column][vc_column width=\"1\/4\"][vc_empty_space height=\"290px\"][vc_btn title=\"Short Course Description\" color=\"danger\" link=\"url:https%3A%2F%2Fwww.nsrec.com%2Fwp-content%2F%2Fuploads%2F2026%2F04%2FNSREC-2026ShortCourse-FLYER_v6-Final.pdf|title:Short%20Course%20Description|target:_blank\"][vc_empty_space height=\"16px\"][vc_btn title=\"Supporter and Exhibitor Registration\" color=\"danger\" link=\"url:https%3A%2F%2Fcvent.me%2FvlPo1L|title:Supporter%20Registration|target:_blank\"][vc_empty_space height=\"16px\"][vc_btn title=\"Hotel Registration\" color=\"warning\" css_animation=\"lightSpeedIn\" link=\"url:https%3A%2F%2Fbook.passkey.com%2Fevent%2F51004057%2Fowner%2F5772432%2Fhome%3Futm_campaign%3D299386963c%26mobile%3Dtrue%26dw%3D414|title:Hotel%20Registration%20|target:_blank\"][vc_empty_space height=\"16px\"][vc_btn title=\"Conference Registration\" color=\"warning\" css_animation=\"lightSpeedIn\" link=\"url:https%3A%2F%2Fcvent.me%2FaW0lgE|title:Conference%20Registration|target:_blank\"][\/vc_column][\/vc_row][vc_row][vc_column][vc_empty_space height=\"16px\"][\/vc_column][\/vc_row][vc_row][vc_column][\/vc_column][\/vc_row]","post_title":"Main Header 2026","post_excerpt":"","post_status":"publish","comment_status":"closed","ping_status":"closed","post_password":"","post_name":"main-header-2026","to_ping":"","pinged":"","post_modified":"2026-07-19 12:34:21","post_modified_gmt":"2026-07-19 12:34:21","post_content_filtered":"","post_parent":0,"guid":"https:\/\/www.nsrec.com\/?post_type=headers&#038;p=8749","menu_order":0,"post_type":"headers","post_mime_type":"","comment_count":"0","filter":"raw"}]},"_links":{"self":[{"href":"https:\/\/www.nsrec.com\/wp-json\/wp\/v2\/pages\/8806","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.nsrec.com\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.nsrec.com\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.nsrec.com\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/www.nsrec.com\/wp-json\/wp\/v2\/comments?post=8806"}],"version-history":[{"count":2,"href":"https:\/\/www.nsrec.com\/wp-json\/wp\/v2\/pages\/8806\/revisions"}],"predecessor-version":[{"id":8950,"href":"https:\/\/www.nsrec.com\/wp-json\/wp\/v2\/pages\/8806\/revisions\/8950"}],"wp:attachment":[{"href":"https:\/\/www.nsrec.com\/wp-json\/wp\/v2\/media?parent=8806"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}