Welcome to Nuclear & Space Radiation Effects Conference
On behalf of the Institute of Electrical and Electronics Engineers (IEEE), its Nuclear and Plasma Sciences Society (NPSS), the Radiation Effects Steering Group (RESG) and the 2024 Nuclear and Space Radiation Effects Conference (NSREC) committee and volunteers, it is my pleasure to invite you to attend the 61st NSREC to be held July 22-26, 2024 at the Westin Ottawa with the adjoining Shaw Centre in Ottawa Canada.
We will offer an excellent Technical program described below:
You are cordially invited to attend the 2024 IEEE Nuclear and Space Radiation Effects Conference to be held July 22-26, 2024 at the Westin Ottawa and Shaw Center in Ottawa Canada. The conference features a technical program consisting of eight to ten technical sessions of contributed papers describing the latest observations in radiation effects, a Short Course on radiation effects issues, a Radiation Effects Data Workshop, and an Industrial Exhibit. The technical program includes oral and poster sessions. Papers on nuclear and space radiation effects on electronic and photonic materials, devices, circuits, sensors and systems, as well as semiconductor processing technology and design techniques for producing radiation-tolerant (hardened) devices and integrated circuits, will be presented at this meeting of engineers, scientists, and managers. International participation is strongly encouraged. We are soliciting papers describing significant new findings in the following or related areas:
Basic Mechanisms of Radiation Effects in Electronic Materials and Devices
- Single-Event Charge Collection Phenomena and Mechanisms
- Ionizing Radiation Effects
- Displacement Damage
- Radiation Transport, Energy Deposition, and Dosimetry
- Materials and Device Effects
- Processing-Induced Radiation Effects
Hardness Assurance Covering Piece Parts, Systems, and Testing Approaches
- New Modeling and Testing Techniques, Guidelines, and Hardness Assurance Methodologies
- Unique Radiation Exposure Facilities, Test Facility Developments, Novel Instrumentation Methods
- Dosimetry
Radiation Effects on Electronic and Photonic Devices, Circuits, and Systems
- Single Event Effects, Total Dose, and Displacement Damage
- MOS, Bipolar, and Advanced Technologies
- Systems on a Chip, GPUs, FPGAs, Microprocessors, and Neuromorphic Devices
- Isolation Technologies, such as SOI and SOS
- Methods for Hardened Design and Manufacturing
- Modeling and Hardening of Devices and Circuits
- Cryogenic or High Temperature Effects
- Novel Device Structures, such as MEMS and Nanotechnologies
- Emerging Modeling and Experimental Techniques for Hardening Systems
Space, Atmospheric, and Terrestrial Radiation Effects
- Characterization and Modeling of Radiation Environments
- Space Weather Events and Effects
- Spacecraft Surface and Internal Charging
- Predicting and Verifying Soft Error Rates (SER)