IEEE Nuclear & Space Radiation Effects Conference

JULY 18-22, 2022


Summaries Due February 4th, 2022


Chair’s Invitation

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Welcome to Nuclear & Space Radiation Effects Conference

On behalf of the Institute of Electrical and Electronics Engineers (IEEE), its Nuclear and Plasma Sciences Society (NPSS), the Radiation Effects Steering Group (RESG) and the 2022 Nuclear and Space Radiation Effects Conference (NSREC) committee and volunteers, it is my pleasure to invite you to attend the 59th NSREC to be held July 18-24, 2022 in Provo, Utah.

We will offer an excellent Technical program described below:

Click here for Final Call for Papers

You are cordially invited to attend the 2022 IEEE Nuclear and Space Radiation Effects Conference to be held July 18-22, 2022 at the Utah Valley Convention Center, Provo, Utah. The conference features a technical program consisting of eight to ten technical sessions of contributed papers describing the latest observations in radiation effects, a Short Course on radiation effects issues with current relevance offered on July 18, a Radiation Effects Data Workshop, and an Industrial Exhibit. The technical program includes oral and poster sessions. Papers on nuclear and space radiation effects on electronic and photonic materials, devices, circuits, sensors and systems, as well as semiconductor processing technology and design techniques for producing radiation-tolerant (hardened) devices and integrated circuits, will be presented at this meeting of engineers, scientists and managers. International participation is strongly encouraged. We are soliciting papers describing significant new findings in the following or related areas:

Basic Mechanisms of Radiation Effects in Electronic Materials and Devices

  • Single Event Charge Collection Phenomena and Mechanisms
  • Ionizing Radiation Effects
  • Displacement Damage
  • Radiation Transport, Energy Deposition, and Dosimetry
  • Materials and Device Effects
  • Processing-Induced Radiation Effects

Radiation Effects on Electronic and Photonic Devices, Circuits, and Systems

  • Single Event Effects, Total Dose, and Displacement Damage
  • MOS, Bipolar, and Advanced Technologies
  • Systems on a Chip, GPUs, FPGAs, Microprocessors
  • Isolation Technologies, such as SOI and SOS
  • Methods for Hardened Design and Manufacturing
  • Modeling and Hardening of Devices and Circuits
  • Cryogenic or High Temperature Effects
  • Novel Device Structures, such as MEMS and Nanotechnologies
  • Emerging Modeling and Experimental Techniques for Hardening Systems

Space, Atmospheric, and Terrestrial Radiation Effects

  • Characterization and Modeling of Radiation Environments
  • Space Weather Events and Effects
  • Spacecraft Charging
  • Predicting and Verifying Soft Error Rates (SER)

Hardness Assurance Technologies, Modeling, and Testing

  • New Modeling and Testing Techniques, Guidelines, and Hardness Assurance Methodologies
  • Unique Radiation Exposure Facilities or Novel Instrumentation Methods
    Dosimetry

New Developments of Interest to the Radiation Effects Community