Technical Program Chair
Sylvain Girard
University St. Etienne
sylvain.girard@univ-st-etienne.fr

Technical Program

You are cordially invited to attend the 2026 IEEE Nuclear and Space Radiation Effects

Conference to be held July 20-24, 2026 at the Puerto Rico Convention Center, San Juan, Puerto Rico. The conference features a technical program consisting of eight to ten technical sessions of contributed papers describing the latest observations in radiation effects, a Short Course on radiation effects issues, a Radiation Effects Data Workshop, and an Industrial Exhibit. The technical program includes oral and poster sessions. Papers on nuclear and space radiation effects on electronic and photonic materials, devices, circuits, sensors, and systems, as well as semiconductor processing technology and design techniques for producing radiation-tolerant (hardened) devices and integrated circuits, will be presented at this meeting of engineers, scientists, and managers. International participation is strongly encouraged. We are soliciting papers describing significant new findings in the following or related areas:

Basic Mechanisms of Radiation Effects in Electronic Materials and Devices

■ Single-Event Charge Collection Phenomena and Mechanisms

■ Ionizing Radiation Effects

■ Displacement Damage

■ Radiation Transport, Energy Deposition, and Dosimetry

■ Materials and Device Effects

■ Processing Related Radiation Effects

Hardness Assurance Covering Piece Parts, Systems, and Testing Approaches

■ New Modeling and Testing Techniques, Guidelines, and Hardness Assurance Methodologies

■ Unique Radiation Exposure Facilities, Test Facility Developments, Novel Instrumentation Methods

■ Dosimetry

Radiation Effects on Electronic and Photonic Devices, Circuits, and Systems

■ Single Event Effects, Total Dose, and Displacement Damage

■ MOS, Bipolar, and Advanced Technologies

■ Systems on a Chip, GPUs, FPGAs, Microprocessors, and Neuromorphic Devices

■ Isolation Technologies, such as SOI and SOS

■ Methods for Hardened Design and Manufacturing

■ Modeling and Hardening of Devices and Circuits

■ Cryogenic or High Temperature Effects

■ Novel Device Structures, such as MEMS and Nanotechnologies

■ Emerging Modeling and Experimental Techniques for Hardening Systems

Space, Atmospheric, and Terrestrial Radiation Effects

■ Characterization and Modeling of Radiation Environments

■ Space Weather Events and Effects

■ Spacecraft Surface and Internal Charging

■ Predicting and Verifying Soft Error Rates (SER)

New Developments of Interest to the Radiation Effects Community