2025 IEEE NSREC TECHNICAL PROGRAM
SESSION C SCHEDULE
NASHVILLE RENAISSANCE HOTEL, NASHVILLE, TN
TUESDAY, JULY 15, 2025
SESSION C
Grand Ballroom 2-3
PHOTONIC DEVICES AND INTEGRATED CIRCUITS
2:15 PM
SESSION INTRODUCTION
Damien Lambert (CEA)
C-1
2:20 PM
Very Low to High Dose Rate Irradiation Response of a Single-Mode Optical Fiber at Telecom Wavelengths
M. Roche1, H. Boiron2, T. Maraine3, E. Marin4, A. Meyer5, D. Lambert6, P. Paillet6, J. Boch3, F. Saigné3, A. Morana4, Y. Ouerdane7, A. Boukenter4, S. Girard7
- Laboratoire Hubert Curien – CEA DAM, France
- Exail, France
- Université de Montpellier, France
- Laboratoire Hubert Curien, France
- Université Jean Monnet, France
- CEA, France
- Université de Saint Etienne, France
We investigate the growth kinetics of the radiation induced attenuation of 25-km long commercial Ge-doped optical fiber coils during a long-term gamma irradiation at different very low dose rates.
C-2
2:35 PM
Analysis of Optical and Electrical Single-Event Transients in Integrated Silicon Photonic Micro-Ring Modulators
B. Ringel1, P. Francis1, J. Teng2, M. Hosseinzadeh1, D. Sam1, Z. Brumbach1, J. Shin1, A. Ildefonso3, A. Khachatrian4, D. Mcmorrow4, J. Hales5, T. Crane5, J. Cressler1
- Georgia Institute of Technology, USA
- The Aerospace Corporation, USA
- Department of Intelligent Systems Engineering, Indiana University, USA
- US Naval Research Laboratory, USA
- Jacobs, Inc. and U.S. Naval Research Laboratory, USA
The SET response of MRMs is evaluated following carrier injection by laser pulses. Optical signals experience transient phenomena plausibly due to carrier and temperature changes. MRMs exhibit SET sensitivity potentially relevant for harsh environment operation.
C-3
2:50 PM
Characterization of Single-Event Effects in Integrated Electronic-Photonic Optical Transceivers for Space-based Communications
M. Hosseinzadeh1, J. Teng2, B. Ringel1, Y. Mensah1, D. Sam1, Z. Brumbach1, A. Ildefonso3, T. Crane4, A. Khachatrian5, D. Mcmorrow5, J. Cressler1
- Georgia Institute of Technology, USA
- The Aerospace Corporation, USA
- Indiana University Bloomington, USA
- Jacobs, Inc., USA
- US Naval Research Laboratory, USA
An integrated optical transceiver in a silicon ePIC platform is exposed to pulsed-laser-induced TPA. SEE sensitivity of subsystems and the full-system is investigated, with a numerical model comparing link sensitivity to different propagating SET types.
C-4
3:05 PM
Low Temperature Proton Irradiation and Annealing Effects on Accumulation CCDs
A. Plocina1, V. Goiffon1, O. Marcelot1, S. Rizzolo2, D. Marchais2, O. Saint-pe2, J. Pratlong3
- ISAE-SUPAERO, France
- Airbus Defence and Space S.A.S., France
- Teledyne e2v, United Kingdom
This study reveals the impact of low temperature on-ground irradiation and annealing on pixel dark currents, activation energies and RTS pixels in silicon detectors, and compares these data to room temperature irradiation test results.
C-5
3:20 PM
Proton-Induced Displacement Damage in AlGaInAs on InP Multi-Quantum-Well Continuous Wave Laser Diodes
C. Bryant1, D. Huang2, K. Arnold1, H. Dattilo1, D. Fleetwood1, R. Schrimpf1, E. Zhang2, P. Harris1, J. Trippe1, M. Alles1, D. Ball1, S. Weiss1, P. Delfyett2, R. Reed1
- Vanderbilt University, USA
- University of Central Florida, USA
The threshold current and the emission wavelength of AlGaInAs-InP lasers change significantly with increasing proton fluence. The observed emission wavelength shift is attributed to defects located in the bandgap, rather than increases in series resistance.
2025 IEEE NSREC POSTER SESSION C
NASHVILLE RENAISSANCE HOTEL, NASHVILLE, TN
WEDNESDAY, JULY 16, 2025
2:50 PM – 4:50 PM
Germantown 1-3
PC-1 Total ionizing dose effects on a PbS-QD-based CMOS direct-conversion X-ray image sensor
C. Zhang1, V. Goossens2, A. Neyret3, R. Quaglia1, V. Goiffon3, A. Shulga2, P. Rüedi1
- CSEM SA, Switzerland
- QDI Systems, Netherlands
- ISAE-SUPAERO, France
This work presents the first observation of ionizing radiation effects on the first PbS-QD-coated CMOS X-ray image sensor from the evolution of dark current, X-ray sensitivity, spatial resolution, and X-ray imaging capability under X-ray irradiation.
PC-2 Dark Current and Random Telegraph Signal Degradation Induced by Proton Radiation in a Long-Wave HgCdTe Infrared Sensor
T. Friess1, E. De Borniol2, A. Antonsanti3, N. Baier2, A. Rouvie4, A. Le Roch4, V. Goiffon3, S. Rizzolo5, O. Gravrand2
- CNES / CEA Leti / ISAE Supaero / Airbus DS, France
- CEA Leti, France
- ISAE-SUPAERO, France
- CNES, France
- Airbus Defence and Space S.A.S., France
Dark current and Random Telegraph Signal degradations were analyzed in an HgCdTe Long-Wave InfraRed (LWIR) sensor after proton irradiation. The evolution of those mechanisms was evaluated after different annealing temperatures.
PC-3 Bias and Geometry Dependent Ionization Effects on Waveguide-Integrated Germanium-Silicon Vertical p-i-n Photodiodes
A. Veluri1, K. Arnold1, S. Musibau2, A. Tsiara2, K. Croes2, D. Linten2, J. Vancampenhout2, S. Kosier1, R. Schrimpf1, D. Fleetwood1, R. Reed1, S. Weiss1
- Vanderbilt University, USA
- imec, Belgium
We investigated ionization effects on Ge-Si VPIN photodiodes under 10-keV X-ray irradiation. Localized P+ doping shows 75% higher dark current sensitivity, while smaller Ge width shows stronger bias-dependent increase. Fast room-temperature recovery confirms space-based viability.
PC-4 Fundamental Mechanisms of Total-Ionizing-Dose Response in Waveguide-Coupled Ge-on-Si PIN Photodiodes
S. Musibau1, K. Arnold2, A. Veluri2, A. Tsiara3, J. Franco3, K. Croes3, D. Linten3, J. Van campenhout3, S. Weiss2, R. Schrimpf2, D. Fleetwood2, S. Kosier2, I. De wolf1, R. Reed2
- imec and KU Leuven, Belgium
- Vanderbilt University, USA
- imec, Belgium
Calibrated TCAD simulations of total-ionizing-dose effects in vertical Ge-on-Si photodiodes reveal dominant charge trapping at top-corner Ge/SiO2 interfaces, enhancing local electric fields, Shockley-Read-Hall generation/recombination rates and trap-assisted tunneling currents.
PC-5 Radiation Reliability of the White LEDs of the MMX mission on Phobos
L. Weninger1, G. Ciachera1, M. Darnon1, A. Morana1, F. Fricano1, V. Lalucaa2, J. Belloir2, C. Durnez2, C. Virmontois2, N. Kerboub2, J. Mekki2, Y. Morilla3, P. Martin Holgado3, A. Romero Maestre3, M. Gaillardin4, O. Duhamel4, P. Paillet4, S. Girard5
- Laboratoire Hubert Curien – UJM, France
- CNES, France
- Centro Nacional de Aceleradores (CNA), Spain
- CEA, France
- Université de Saint Etienne, France
This work presents the results on the external quantum efficiency degradation under various ionizing radiations of the white LEDs selected for the illumination system of the cameras of the MMX mission rover on Phobos.