Short Course Sessions

Multi-Scale, Multi-Physics of Radiation Effects

Short Course attendees will receive the

1980-2022 Short Course Compendium

2022 NSREC Short Course
July 18, 2022

On behalf of the 2022 IEEE Nuclear and Space Radiation Effects Conference (NSREC) Committee, I cordially invite you to attend the 43rd IEEE NSREC Short Course. An outstanding group of technical experts will provide an in-depth discussion of the multi-scale, multi-physics of radiation effects on microelectronics.

Dr. Sylvain Girard
Universite de Saint-Etienne
Short Course Chair

Short Course Flyer

Course Description

A short course, Multi-Scale, Multi-Physics of Radiation Effects, will be presented at the 2022 IEEE Nuclear and Space Radiation Effects Conference. A comprehensive understanding of radiation effects on modern microelectronics requires combining experimental and theoretical tools in order to assess the physical processes occurring at various scales. First, the relevant radiation environment should be determined and radiation transport through any materials surrounding the circuit or device of interest should be modeled. Then, the deposited energy can be evaluated as well as its conversion into charges or defects. The transport and recombination of these charges in the semi-conductor and insulator regions,  their trapping in insulators or at the interfaces are at the basis of the description of electrical impact of radiation-induced defects and of the cumulative or transient effects at device, circuit or system levels.

The short course is organized into four sections, all featuring introductory material and advanced topics, with an emphasis on the physics involved in the radiation effects on microelectronics. The first section addresses the natural and man-made radiation environments, with emphasis on the simulation toolkits for the radiation-matter interactions. The second part focuses on the basics of radiation effects on microelectronic components and systems, discussing the single-event and total ionizing dose effects and focusing on their experimental characterizations. The third section illustrates the multi-scale approaches and associated simulation tools that can be used to model the total ionizing dose effects at the various scales, from the device to the circuits. The final course deals with the existing multiscale simulation tools for Single Event Effects. The topics covered should benefit people new to the field as well as experienced engineers and scientists, by providing up-to-date material and insights.

The short course is intended for radiation effects engineers, component specialists, system designers, and other technical and management personnel involved in developing reliable systems designed to operate in radiation environments. It provides a unique opportunity for IEEE NSREC attendees to benefit from the expertise of excellent instructors, along with a critical review of state-of-the-art knowledge in the field. Electronic copies of detailed course notes will be provided to each participant.

Continuing Education Units (CEUs) will be available. For the interested attendees, an exam will be given at the end of the short course. The course is valued at 0.6 CEUs, and is endorsed by the IEEE and by the International Association for Continuing Education and Training (IACET).